p: (978) 535-5900     e: salesinfo@jeol.com


JSM-7200F Analytical Field Emission SEM

Electron microscopy is an invaluable tool for mapping the brain for advanced neuroscience studies. The use of STEM-in-SEM (Scanning Transmission Electron Microscopy in a SEM) provides enhanced image contrast at lower voltages making it an excellent method for the characterization of thin sections of brain.

An integrated Gatan 3View® Serial Block Face Imaging System creates perfectly aligned image stacks of thousands of sequentially-imaged slices of the freshly cut, resin embedded block face sample.

JSM-7200F is a full-featured Field Emission SEM that increases analytical resolution to the sub100nm scale. The ultra-versatile JSM-7200F is an easy-to-use analytical SEM that combines large beam currents with a small probe size at any accelerating voltage. When combined with the 3View, high-stability and high-resolution is maintained throughout the entire 3D volume.

The JSM-7200F Advantage

  • High resolution imaging and nanoanalysis
  • Outstanding low kV performance
  • High stable current with double condenser lens and aperture angle control lens
  • Multi-port chamber for in situ nanoloab utility

3D image created by 3View Block Face Imaging and JSM-7100FT

STEM image of brain

Technical Note

Researchers who visited this page also expressed interest in: