JSM-7200F Analytical Field Emission SEM
Electron microscopy is an invaluable tool for mapping the brain for advanced neuroscience studies. The use of STEM-in-SEM (Scanning Transmission Electron Microscopy in a SEM) provides enhanced image contrast at lower voltages making it an excellent method for the characterization of thin sections of brain.
An integrated Gatan 3View® Serial Block Face Imaging System creates perfectly aligned image stacks of thousands of sequentially-imaged slices of the freshly cut, resin embedded block face sample.
JSM-7200F is a full-featured Field Emission SEM that increases analytical resolution to the sub100nm scale. The ultra-versatile JSM-7200F is an easy-to-use analytical SEM that combines large beam currents with a small probe size at any accelerating voltage. When combined with the 3View, high-stability and high-resolution is maintained throughout the entire 3D volume.
The JSM-7200F Advantage
- High resolution imaging and nanoanalysis
- Outstanding low kV performance
- High stable current with double condenser lens and aperture angle control lens
- Multi-port chamber for in situ nanoloab utility