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JEOL is a leading global supplier of electron microscopes, ion beam instruments, mass spectrometers and NMR spectrometers.

JEOL instruments are helping to advance scientific research throughout the world. JEOL instruments support discoveries in virology, biological and medical research, drug discovery and genomics, national defense, forensics, failure analysis, nanotechnology, and novel materials.

What can we help you achieve?

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SEM

Scanning Electron Microscopy

JEOL Scanning Electron Microscopes offer the ultrahigh resolution and versatility that empower today's microscopist to image and characterize a new generation of nanomaterials, capture biological details, analyze forensic evidence, create nanopatterns, and pinpoint problems in manufacturing processes.

HV/LV Tungsten/LaB6 • Atmospheric SEM
Portable and Benchtop • FE SEM • SEM-FIB
Stage Navigation System

TEM

Transmission Electron Microscopy

JEOL innovations in Transmission Electron Microscopy are legion, ranging from ultrahigh resolution optics with Cs correction for atom-to-atom characterization, to advanced 3D tomography for the life sciences. Our TEMs enable researchers to investigate samples using cryotomography, STEM, MDS, EDS, EDXA and EELS.

120kV • 200kV • 300kV
Analytical • Software
Thin Film Phase Plate Technology

Microprobe

Surface Analysis

JEOL has long led the way in Surface Analysis instruments with Auger Microanalyzers, Electron Probe Microanalyzers (EPMA), and Photoelectron Spectrometers. JEOL Auger Microprobes offer the highest resolution available.

JAMP-9500F Field Emission Auger Microprobe
JXA-8230 SuperProbe EPMA
JXA-8530F EPMA

Sample Prep

Sample Preparation

JEOL leads the way in cross section preparation solutions for difficult materials, including composites, oil shale, coatings, paper, and solar panels. Our sample preparation tools include FIB for micro milling and imaging for semiconductor and composite materials, and a vacuum evaporator for carbon coating.

Cross Section Polisher • Ion Slicer
Vacuum Evaporator • Focused Ion Beam System

Analytical Inst.

Analytical Instruments

JEOL is renowned for innovations in mass spectrometry. We introduced the Direct Analysis in Real Time (DART) open air ion source as well as the first MALDI-TOF/TOF of its kind. We offer exact mass, high resolution LC/MS and GC/MS. JEOL has a long history in the field of Nuclear Magnetic Resonance (NMR) and Electron Spin Resonance (ESR).

Mass Spectrometers
Nuclear Magnetic Resonance (NMR) Spectrometers
Electron Spin Resonance (ESR) Spectrometers

Lithography

Lithography

JEOL has produced lithography tools for more than 40 years, and offers semiconductor manufacturers a comprehensive line of e-beam systems for photomask and direct write, as well as a lineup of wafer inspection tools. JEOL semiconductor equipment is backed by award-winning 24/7 service support and long-term commitment to our customers.

Electron Beam Lithography • Wafer Inspection SEM
Fine Process Inspection

Medical

Medical Equipment

JEOL’s innovative, cost-effective systems for medical diagnoses and analyses integrate routine clinical chemistry, hematology, immunodiagnostics, and laboratory automation.

High Throughput Clinical Chemistry Analyzer
Next-generation Amino Acid Analyzer

Industrial