Emory University Orders Two JEOL Cryo-TEMs for Expanding the Electron Microscopy Core
First biological Field Emission TEM in the state of Georgia; will establish Emory University as a unique center for biological imaging
 

JEOL Scanning Electron Microscope Offers Versatile Through-the-Lens System for Ultrahigh Resolution
Combines new objective lens and detector technologies with the proven JEOL in-lens Field Emission Gun
 

JEOL Correlative Microscope Wins MT-10 Award
Top honors for the JEOL ClairScope
 

JEOL AccuTOF-DART Mass Spectrometer Used in Georgia Institute of Technology’s Newly-Developed Ovarian Cancer Test
New Paper Published in Epidemiology, Biomarkers, & Prevention Research
 

New Cold Field Emission Gun Enhances Ultrahigh Atomic Level Resolution of JEOL ARM200F Aberration-Corrected S/TEM
 Imaging resolution guaranteed at 78 picometers with an energy resolution of 0.3 eV
 

New JEOL Correlative Microscope Makes U.S. Debut at M&M and Northwestern University after Winning R&D 100 Award
This August, JEOL USA will demonstrate the first correlative microscope to enable concurrent light microscopy and atmospheric scanning electron microscopy (ASEM) for observation of and experimentation on samples in their native state.
 

Scanning Electron Microscope Reveals “The Scream” in Oil Shale
Who says science isn’t fun?
 

JEOL Reinvents Time-of-Flight Mass Spectrometry with Innovative SpiralTOF™ MALDI-TOF System
Reinvents Time-of-Flight ion optics with an extended flight length in a compact footprint
 

JEOL Offers First Commercially-Available Thin Film Phase Plate Technology for TEM
Multifold Increase in Biological Specimen Imaging Contrast
 

Award-winning Pioneer in Nanoscience Research Visits JEOL USA
Nanoscience owes much to the discoveries of world renowned physicist Dr. Sumio Iijima
 

UT Dallas Re-energizes Semiconductor Nano Research with Acquisition of New JEOL Atomic Resolution Microscope
UT Dallas advances its role as key contributor to the development of next-generation semiconductor devices
 

First JEOL JEM-ARM200F Electron Microscope Produces Atomic Resolution Data in Record Time at University of San Antonio
Demonstrates the stability of this all-new instrument and the skill of the UTSA-JEOL team to quickly power up the first TEM of its kind.
 

New JEOL Microprobe Helps Advance Research Opportunities for Students and Industry in North Carolina
Will expand research and educational opportunities for students, faculty, and industry in southeastern North Carolina.
 

New DART SVP Source and iDART Automation Streamline JEOL AccuTOF-DART™ Time-of-Flight Mass Spectrometer Performance
Offers a new set of performance features for accurate mass measurements in real time using advanced time-of-flight technology.
 

JEOL Cryo-TEM to Enable New Structural Biology Research at University of Texas El Paso
Will provide capabilities to establish world class facility at UTEP
 

JEOL Canada Increases Sales Support for Scientific Instrumentation
Appointments of new sales manager and customer service representative
 

JEOL Introduces a New Correlative Microscopy Tool for Observing Biological Samples and Materials in Atmosphere
New ClairScope™ Combines Atmospheric Scanning Electron Microscope (ASEM) with Light Microscope
 

JEOL TEM Specialist to Serve as Visiting Scientist at Lehigh University
JEOL Applications Specialist Dr. Toshi Aoki helping customers optimize the powerful imaging and analysis capabilities of their JEOL field emission TEMs.
 

JEOL to Remotely Demonstrate New High Throughput, Ultrahigh Resolution Analytical FE SEM at Semicon West 2009
SEM will be remotely operated from JEOL’s booth #606 to demonstrate ultrahigh imaging resolution at up to 1,000,000X magnification, and X-ray analytical mapping of individual layers, elemental composition, contaminants, particulates, and process defects in semiconductor devices.