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EM-09100IS Ion Slicer

Innovative Specimen Preparation Method for TEM / STEM / SEM / EPMA / AUGER

EM-09100ISThe Ion Slicer can prepare thin-film specimens without solvents or chemicals and requires no prior treatment of the specimen other than rectangular slicing (no disc grinding or dimple grinding).

The Ion Slicer prepares thin-film specimens faster and easier than conventional preparation tools. A low-energy, low-angle Ar ion beam irradiates the specimen while a thin shield belt allows low-angle irradiation of the Ar ion beam (from 0° to 6°), drastically reducing ion-beam irradiation damage to the specimen. The result is a high-quality thin film with few sputtering artifacts--even in soft materials. The Ion Slicer can efficiently prepare thin films from specimens having different compositions, even those having porous composites.

Highlights include:

  • High quality TEM pre-treatment
  • Fast preparation
  • No complicated pre-treatments
  • Minimal surface damage

EM-09100IS Key Product Features

Ion accelerating voltage 1 to 8 kV
Tilt angle Up to ±6° (0.1° step)
Beam diameter 500µm (FWHM)
Milling rate 5µm/min (8 kV, silicon)
Gas for beam irradiation Argon
Recommended specimen size 2.8mm (length) x 0.5 mm (width) x 0.1mm (thickness)
Pressure measurement Penning gauge
CCD camera Built-in
Dimension and weight Main console 500mm (W) x 600mm (D) x 547mm (H), 63kg
Rotary pump 150mm (W) x 427mm (D) x 230.5mm (H), 16kg
LCD monitor 326mm (W) x 173mm (D) x 380mm (H), 3.7kg