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Catch the Next Wave of Technology Leadership

Come and explore our innovative microscopy technology and research solutions.

See us at M&M 2016 booth #502

(until then, have fun exploring the images below)

Kazutomo Suenaga, Team Leader, and collaborators from the Nanomaterials Research Institute (NMRI) of the National Institute of Advanced Industrial Science and Technology (AIST)
M&M 2016
Single dopant atom spectroscopy
JEM-F200 TEM
M&M 2016
Silicon 110 from F2 TEM with analytical polepiece
The silicate nanoshell particle contains iron oxide concentrated on the inside of the shell; the bright red ring shows this. Prof. Moon Kim’s group: Ning Lu – University of Texas at Dallas, Sample from Prof. Andrew Kummel at UC San Diego; JEM-ARM200F STEM HAADF imaging, pseudo-coloring
M&M 2016
"NanoSun" 500 nanometer silicate nanoshell particle
Beam energy: 300 kV; exposure: 1 s. OneView high resolution and high sensitivity camera shows lattice imaging with a large field of view. JEOL, Ltd. Japan and Gatan, Inc., US. Image taken on JEOL Grand ARM Atomic Resolution TEM.
M&M 2016
Au nanoparticles
The five distinct regions are indicative of its five-fold rotational symmetry, colorized for easy viewing. Moon Kim’s group: Ning Lu, Jinguo Wang - University of Texas (Dallas). Sample from Prof. Younan Xia at Georgia Tech. Method/Instrument: JEM-ARM200F STEM HAADF imaging, pseudo-coloring
M&M 2016
"NanoStar" STEM HAADF image of a Pd-Rh bimetallic nano-particle during the early stages of its formation
Janet E. Schwarz, Univ. of Vermont Microscopy Imaging Center; JEM-1400 TEM
M&M 2016
"Surf's Up" - Human colonic mucosa
Sub-nanometer resolution using cryo-EM images acquired by JEOL Automated Data Acquisition System (JADAS) software
M&M 2016
Icosahedral reconstruction of a bacteriophage epsilon-15
Dr. Patrick C. Nahirney, University of Victoria; JEM-1400 TEM
M&M 2016
Cross-section through middle pieces of developing spermatids in seminiferous tubule epithelium (adult male rat)
JEM-ARM200F with large angle SDD-EDS
M&M 2016
High speed, high resolution automatic EDS map (1 min 13 sec) 100 mm2
Professor Emeritus K. Hiraga – Tohoku University JEM-F200 TEM
M&M 2016
STEM-HAADF image of Quasicrystal
Sample was prepared using JEOL Cross Section Polisher and analyzed using FESEM
M&M 2016
EDS map of C distribution in a ceramic composite of Al, Si, and C
Analysis done with JSM-IT300LV tungsten SEM
M&M 2016
Cathodoluminescence image of zircon
Scott Payne, North Dakota State University Electron Microscopy Core Facility JEOL JSM-6490LV; Brass cryo-puck; frozen in liquid nitrogen, fractured using a pre-cooled razor blade. Puck transferred cold to SEM in LVmode (30 Pa); allowed to sublime for 10 minutes to remove any frost. BSE shadow mode at 15 kV
M&M 2016
Cooked fully hydrated lentil showing starch microstructure
Sample was prepared using JEOL Cross Section Polisher and analyzed using FESEM
M&M 2016
EDS map of ceramic composite of Al (blue), Si (yellow), and C (red)
The image is overlaid with a corresponding EBSD orientation map
M&M 2016
FESEM image of magnetic domains in electrical steel
High resolution FESEM image
M&M 2016
Nano-sized magnetite powder cluster
Fine filaments that are tensioned by sound and that pull open ion channels. Dr. David P. Corey, Howard Hughes Medical Institute and Department of Neurobiology, Harvard Medical School, Boston. Field Emission SEM
M&M 2016
Stereocilia, hairlike projections in the inner ear connected by tip links
Craig Stringer, Atlas Pressed Metals, JEOL JSM-6010Plus/LA
M&M 2016
"Tiny Forest of Metal Trees" Iron-Copper-Carbon growth on a powder metallurgy component
The sample was prepared using JEOL cross section polished and analyzed with FESEM
M&M 2016
EDS map of a battery cross section
High resolution FESEM image
M&M 2016
Anopore membrane

M&M 2016 Schedule of Events

Scientific Papers and Posters – Monday July 25th

Monday – 3pm

A06.P1 Analytical Electron Microscopy for Advanced Characterization from Multi-Dimensional Data Acquisition to Integrated Analysis
POSTER # 3
3:00 PM Effective Method for Decreasing Detection Limit of Dopant Concentration in Semiconductor Using Dual SDD Analysis System; K-I Fukunaga, N Endo; JEOL, Ltd, Japan; M Suzuki; Thermo Fischer Scientific Japan; Y Kondo; JEOL, Ltd, Japan

POSTER # 4
3:00 PM Ultrahighly Efficient X-Ray Detection System of Two Very Large Sized SDDs for Aberration Corrected 300 kV Microscope; I Ohnishi, K Miyatake, Y Jimbo, Y Iwasawa, M Morita, T Sasaki, H Sawada, E Okunishi; JEOL, Ltd, Japan

A11.P1 Advances in Scanning Electron/Ion Instrumentation and Detectors
POSTER # 25
3:00 PM The Study of “Window-less” EDS Detector with Low Voltage FE-SEM; Y Yamamoto, H Takahashi; JEOL, Ltd, Japan; H Morita, Oxford Instruments, Japan; H Yamada, National Institute of Technology, Japan; M Takakura, N Kikuchi, T Nokuo; JEOL, Ltd, Japan; N Erdman; JEOL USA, Inc.

P02.P1 Electron Microscopy of Materials for Electrochemical Power Systems
POSTER # 60
3:00 PM Analytical Electron Microscopy Study of SiSn/(Reduced Graphene Oxide) Nanocomposite Powder Applicable to Li-Ion Battery Anodes; M Kawasaki; JEOL USA, Inc.; V Laokawee, T Sarakonsri; Chiang Mai University, Thailand; T Hashizume; University of Toyama,
Japan; M Shiojiri; Kyoto Institute of Technology, Japan

Scientific Papers and Posters – Tuesday July 26th

A06.2 Analytical Electron Microscopy for Advanced Characterization from Multi-Dimensional Data Acquisition to Integrated Analysis
Room C224-225
8:45 AM Pseudo Atomic Column EELS & EDS Mapping of Silicon Reconstructed with K and L Electrons Using STEM Moire Method; Y Kondo, E Okunishi; JEOL, Ltd., Japan

A06.3 Analytical Electron Microscopy for Advanced Characterization from Multi-Dimensional Data Acquisition to Integrated Analysis
Room C224-225
11:00 AM Automated 3D EDS Acquisition for Spatially Resolved Elemental Characterization of Catalyzed MgH2 Nanostructures; B Van Devener; The University of Utah; KJ Mcilwrath; JEOL USA, Inc., S Kim; AppFive LLC; Z Zak Fang, C Zhou; The University of Utah

A15.3 Quantitative Measurement of Intensities and Distances in Electron Microscopy
Room C212
10:30 AM (INVITED) Direct Electromagnetic Structure Observation by Aberration-Corrected Differential Phase Contrast Scanning Transmission Electron Microscopy; N Shibata; The University of Tokyo, Japan; SD Findlay; Monash University, Australia; T Matsumoto, T Seki, G Sanchez-Santolino; The University of Tokyo, Japan; Y Kohno; JEOL, Ltd., Japan; H Sawada; JEOL, Ltd., United Kingdom, Y Ikuhara; The University of Tokyo, Japan; et al.

A09.P1 - Advanced Scanning Diffraction: Mapping Functionality in Reciprocal Space at Nanometer Resolution
POSTER # 124
3:00 PM Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM; M Simson; PNDetector GmbH, Germany; RE Dunin- Borkowski; Ernst Ruska-Centre, Forschungszentrum Julich, Germany; R Hartmann; PNSensor GmbH, Germany; M Huth, S Ihle; PNDetector GmbH, Germany; L Jones; University of Oxford, United Kingdom; Y Kondo; JEOL, Ltd., Japan, V Migunov; Ernst Ruska-Centre, Forschungszentrum Julich, Germany; et al.

P01.P1 - Dr. Gareth Thomas Symposium: Materials Solutions through Microscopy
POSTER # 172
3:00 PM Further Development of an Environmental HVTEM for Reaction Science by a New Non-Exposure Transfer Holder; N Tanaka, S Arai; Nagoya University, Japan; S Ohta; JEOL, Ltd., Japan

P11.P1 Metallography and Microstructural Characterization of Metals
POSTER # 186
3:00 PM Solid State Reaction Detected Between Hexagonal Boron Nitride and Iron During Sintering; KP Furlan, DR Consoni; Universidade Federal de Santa Catarina, Florianopolis, Brazil; B Leite; JEOL USA, Inc., AN Klein; Universidade Federal de Santa Catarina, Florianopolis, Brazil

X91.P1 - A Family Affair
POSTER # 206
3:00 PM Complex Web Construction: a Possible Clue to Mechanical Properties an Investigation by Middle School Students in Collaboration with MIT and JEOL, USA; DX Shattuck; Concord Middle School, Massachusetts

Scientific Papers and Posters – Wednesday July 27th

A06.6 Analytical Electron Microscopy for Advanced Characterization from Multi-Dimensional Data Acquisition to Integrated Analysis
Room C224-225
11:45 AM Improvement of Imaging Performance with a New ASCOR Probe-Corrector in a 200 kV JEM-ARM200CF; M Watanabe; Lehigh University; T Nakamura; JEOL USA, Inc.; T Ishikawa; JEOL, Ltd., Japan

A08.2 Quantitative and Qualitative Microanalysis by EPMA and SEM
Room C113
11:15 AM Collecting and Analysing - 1.6eV - 20keV Emission Spectra in an EPMA; CM MacRae, N Wilson, A Torpy; CSIRO, Australia; J Bergmann; Bruker, Australia; H Takahashi; JEOL, Ltd., Japan

11:45 AM Chemical States Analysis of Trace-Boron by Using an Improved SEM-SXES; M Terauchi; Tohoku University, Japan; H Takahashi, M Takakura, T Murano; JEOL, Ltd., Japan; M Koike, T Imazono; Japan Atomic Energy Agency; T Nagano, H Sasai; Shimadzu Corporation, Japan; et al

A08.3 Quantitative and Qualitative Microanalysis by EPMA and SEM
Room C113
2:30 PM Low Voltage Soft X-Ray Emission Analysis from 100 V for Depth Chemical Information from a Few nm to Several Hundred nm; H Takahashi, S Asahina, T Kanazawa, Y Yamamoto, Y Sakuda; JEOL, Ltd., Japan; M Terauchi; Tohoku University, Japan; V Robertson, P McSwiggen; JEOL USA, Inc., et al.

B04.P1 Microscopy and Morphogenesis
POSTER # 234
3:00 PM Structural and Biomechanical Study of Clarinet Reeds Made from Arundo donax; M Kawasaki; JEOL USA, Inc.; T Nobuchi; Kyoto University, Japan; Y Nakafusi, M Nose; University of Toyama, Japan; M Shibata; JEOL USA, Inc., M Shiojiri; Kyoto Institute of Technology, Japan

Scientific Papers and Posters – Thursday July 28th

A02.1 TEM Phase Plate Imaging in Biological and Materials Science
Room C111
9:00 AM (INVITED) Contrast Enhancement of Long-Range Periodic Structures Using Hole-Free Phase Plate; H Iijima, Y Konyuba, N Hosogi, Y Ohkura; JEOL, Ltd., Japan; H Jinnai, T Higuchi; Tohoku University, Japan

9:30 AM Contrast Enhancement of Nano-Materials Using Phase Plate STEM; H Minoda, T Tamai; Tokyo University of Agriculture and Technology, Japan; H Iijima, Y Kondo; JEOL, Ltd., Japan

A16.2 New Frontiers in Monochromated EELS
Room C224-225
9:45 AM Ultra-High Energy Resolution EELS Mapping Using Aberration-Corrected Low-voltage STEM Equipped with Monochromator; M Masaki, M Shigeyuki, S Hidetaka; JEOL, Ltd., Japan; S Kazu; National Institute of Advanced Industrial Science and Technology, Japan

A08.P1 Quantitative and Qualitative Microanalysis by EPMA and SEM
POSTER # 326
10:00 AM Low Voltage X-Ray Mapping: The Complementary Methods of the Oxford Instruments X-Max Extreme Windowless EDS Detector and the JEOL Soft X-Ray Emission Spectroscopy (SXES); G McMahon, G Burke; University of Manchester, United Kingdom; S Burgess; Oxford Instruments Nanoanalysis, United Kingdom; M Takakura, H Takahashi; JEOL, Ltd., Japan
POSTER # 335
10:00 AM A SXES and CL Spectral Library for the Analysis of Rare Earth Elements; CM MacRae, NC Wilson, A Torpy; CSIRO, Australia; H Takahashi, M Takaura, T Murano; JEOL, Ltd., Japan; C Lenz; CSIRO, Australia

A16.4 New Frontiers in Monochromated EELS
Room C224-225
4:45 PM Improvement of TEM Spatial Resolution at Low Accelerating Voltages (15 - 30 kV) with Monochromator; S Morishita, M Mukai; JEOL, Ltd., Japan; K Suenaga; National Institute of Advanced Industrial Science and Technology, Japan; H Sawada; JEOL, Ltd., United Kingdom

M&M 2016 In-Booth Presentations – JEOL Booth #502

Please be sure to sign up at M&M conference booth or contact salesinfo@jeol.com

Monday – 5:30pm

Catalysis Research Utilizing Atmosphere Environmental Cell on the JEOL ARM300F GrandARM
Dr. Ichiro Ohnishi-san, JEOL LTD
Dr. Ben Jacobs, Protochips

Tuesday – 5:30pm

In-Situ TEM with Environmental Cell Holders
JEOL USA Inc.
Hummingbird Scientific

Wednesday – 5:30pm

An Advanced Cryo TEM for Automated Data Acquisition
JEOL USA Inc.