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UNLOCK THE ANSWERS

TO YOUR FAILURE ANALYSIS QUESTIONS

SMART FLEXIBLE POWERFUL SEM

  • Intuitive, point and shoot operation
  • Fully automated, fast imaging and analysis
  • Powerful performance at your fingertip
  • Large specimen chamber

PRISTINE SAMPLE PREP

  • Pristine cross sections for observing voids and fractures
  • Ideal preparation for EBSD analysis
  • Wide area cross sections

EDS of cross section of wire bond

Ductile and brittle fracture with an inclusion
Courtesy of Sheri Neva, EAG

EDS of cross section of lithium battery

Fracture in wire bond

Rust

EBIC imaging of semiconductor device

SMART FLEXIBLE POWERFUL Imaging & Analysis Solutions

When you need fast answers to your failure analysis questions, JEOL Scanning Electron Microscopes characterize and analyze samples with ease.

Scanning electron microscopes (SEMs) are one of the most powerful, versatile tools for scientists due to their large depth of field (compared to light microscopes), high spatial resolution (high magnification) and analytical capabilities (energy dispersive x-ray, or EDS and wavelength dispersive spectroscopy, or WDS) for chemical analysis.

The ability to add electrical, mechanical, and chemical test equipment makes the microscope a self-contained "micro laboratory."