JEOL USA Press Releases

August 11, 2009 (Peabody, Mass.) -- JEOL, a leading supplier of high resolution, high performance Scanning Electron Microscopes (SEM) and atomic resolution Transmission Electron Microscopes (TEM), has developed two new publications that explain theory and operation of the SEM for routine imaging and elemental analysis. These two new books can be downloaded from the JEOL USA website (jeolusa.com) under the Resources tab. They are a useful resource for novice users of SEM or anyone teaching ...

June 30, 2009 (Peabody, Mass.) -- JEOL, a leading supplier of electron microscopes for ultrahigh resolution imaging and analysis, will demonstrate its new ultrahigh resolution, analytical Thermal Field Emission Scanning Electron Microscope (SEM), the JSM-7600F, via live remote viewing and control from Semicon West, San Francisco, July 14-16. The SEM will be remotely operated from JEOL’s booth #606 to demonstrate ultrahigh imaging resolution at up to 1,000,000X magnification, and X-ray analytical mapping of individual layers, ...

The city of Morgantown, West Virginia, home to West Virginia University, is making national headlines as an “economic oasis.” It is one of the few U.S. locations to be successfully isolated from the current recession, offering diverse opportunities for employment and research plus a low cost of living. Isolation of another kind is occurring in the University’s Nanosystems Engineering Shared Cleanroom (NESC), where Dr. Kolin Brown is installing a new e-beam lithography/scanning electron microscope (SEM). ...

May 8, 2009, Peabody, Mass. -- A new e-brochure from JEOL illustrates the application of an ion beam cross section polisher for SEM sample preparation of solar panel thin films and kerogen-rich shale samples. The online brochure includes SEM images as well as movie and 3D files of complex shale composites and EBSD orientation maps of solar panel thin films. The JEOL cross section polisher produces cross sections without smearing, crumbling, or distortion - ...

Peabody, Mass., April 30, 2009 -- JEOL USA, the leading supplier of electron microscopes and scientific instrumentation to research labs, industry, health and investigative organizations throughout North and South America, announced the promotion of Peter Genovese to the position of President. Mr. Genovese, a member of the JEOL sales organization for more than 25 years, most recently served as Vice President and General Manager of the Sales and Marketing Division of the company. He ...

April 28, 2009 (Peabody, MA) -- For now, scientists at Florida State University (FSU) can only envision what some misoriented atoms are up to along the defects of the new materials that they are developing. They’ll finally be able to clearly see each individual atom and how it relates to its neighbors when they take delivery of a new JEOL atomic resolution Scanning Transmission Electron Microscope (S/TEM) later this year. FSU’s Applied Superconductivity Center, housed ...

Peabody, Mass., March 10, 2009 – The year 2009 marks the introduction of a new generation of Transmission Electron Microscope (TEM) for JEOL, as well as the 60th anniversary of the company with the longest history of innovation and leadership in electron microscopy. JEOL is pleased to introduce the new JEM-ARM200F atomic resolution analytical microscope. Highest Resolution Commercially Available According to JEOL USA, the company’s U.S. subsidiary, JEOL has unveiled its new JEM-ARM200F atomic resolution analytical ...

PITTCON, Chicago, Ill.—JEOL USA, renowned for its expertise as a leading supplier of electron microscopes for research and industrial problem solving, and the College of Microscopy, the education division of The McCrone Group, are proud to announce an increased partnership and joint commitment to improving the study of microscopy. JEOL USA will provide a new JSM-6610LV low vacuum high-performance Scanning Electron Microscope (SEM) to the College of Microscopy for use in basic and advanced training ...

Peabody, Mass., March 6, 2009 -- The new AccuTOF-GCv from JEOL features the highest sensitivity of any GC time-of-flight mass spectrometer commercially available. By combining rapid data acquisition speeds with high resolution and a high dynamic range, the AccuTOF-GCv delivers exact mass measurements for both qualitative and quantitative analysis. The new AccuTOF-GCv introduces several new software features including automatic ion source tuning, automatic drift calibration, automatic data file conversion and export. The Tuning Assistant function ...

Peabody, Mass., March 5, 2009 -- JEOL, renowned for its role in the development and manufacture of advanced electron microscopy and spectroscopy products since 1949, kicks off its 60th anniversary celebration at Pittcon (Chicago, March 8-13, 2009), the premier conference and exposition on laboratory sciences. Pittcon, also celebrating its 60th anniversary, is known for being the exhibition where companies debut their latest products and technology. JEOL USA will introduce new microscopy and spectrometry instrumentation, as ...