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JEOL USA Press Releases

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New JEOL Microprobe Helps Advance Research Opportunities for Students and Industry in North Carolina
February 8, 2010, Peabody, Mass. -- The installation of an advanced imaging tool, a JEOL Electron Probe Microanalyzer (EPMA), will expand research and educational opportunities for students, faculty, and industry in southeastern North Carolina. In January, JEOL completed the installation of its new generation of EPMA, also known as a microprobe, at the Southeastern North Carolina Regional Microanalytical and Imaging Center (SENCR-MIC), a state-of-the-art facility opened in 2009 as a joint collaboration between Fayetteville ...


New DART SVP Source and iDART Automation Streamline JEOL AccuTOF-DART™ Time-of-Flight Mass Spectrometer Performance
January 21, 2010, Peabody, Mass. -- JEOL’s award-winning AccuTOF-DART™ mass spectrometer, featuring the new iPod touch-enabled DART SVP ion source, offers a new set of performance features for accurate mass measurements in real time using advanced time-of-flight technology. JEOL introduced the Direct Analysis in Real Time (DART™) ion source in 2005 for its AccuTOF-LC mass spectrometer, expanding the system’s capability with the first commercially-available open air analysis source that produced immediate, accurate mass spectra with ...


JEOL Cryo-TEM to Enable New Structural Biology Research at University of Texas El Paso
December 16, 2009 (Peabody, Mass.) -- The University of Texas El Paso has selected a JEOL cryo-electron microscope for its emerging structural biology program to be housed in a new building planned for completion in 2011 on the UTEP campus. The JEM-3200FS that was ordered from JEOL USA is a 300 keV cryo-TEM with an omega energy filter for increased contrast and high resolution. The UTEP research program directed by structural biologists Dr. Ricardo Bernal ...


JEOL Canada Increases Sales Support for Scientific Instrumentation
December 1, 2009, Peabody, Massachusetts, USA – JEOL, globally-recognized for its advanced Electron Microscopes, Spectrometers, and E-Beam Lithography tools, announces the appointment of a new JEOL Canada Sales Manager. Richard Humphrey of Calgary, Alberta, will represent JEOL throughout all Canadian provinces with the exception of Quebec and Eastern Ontario, which will continue to be represented by Soquelec, Ltd., a JEOL partner since 1981. "I believe JEOL is moving in the right direction to solidify its ...


JEOL Introduces a New Correlative Microscopy Tool for Observing Biological Samples and Materials in Atmosphere
October 21, 2009, Peabody, Mass. -- JEOL, a global leader in the development and manufacture of scanning and transmission electron microscopes, introduces ClairScope™, a first-of-its kind correlative microscopy tool that combines a high-end Light Microscope (LM) with a high-resolution Atmospheric Scanning Electron Microscope (ASEM). The new JEOL ClairScope enables uncompromised observation of samples in their native state using both LM and ASEM, significantly reducing sample preparation time and allowing dynamic observation of real time ...


JEOL TEM Specialist to Serve as Visiting Scientist at Lehigh University
With just the right touch for fine tuning the optics of ultrahigh resolution microscopes, JEOL Applications Specialist Dr. Toshi Aoki is helping customers optimize the powerful imaging and analysis capabilities of their JEOL field emission TEMs. Starting in September, he will also serve as Visiting Scientist at Lehigh University, with opportunities to co-publish on new discoveries while putting the 200 keV FE TEM with Cs STEM corrector through its paces. High resolution microscopy has fascinated ...


Download SEM Theory and Operation Books from JEOL Website
August 11, 2009 (Peabody, Mass.) -- JEOL, a leading supplier of high resolution, high performance Scanning Electron Microscopes (SEM) and atomic resolution Transmission Electron Microscopes (TEM), has developed two new publications that explain theory and operation of the SEM for routine imaging and elemental analysis. These two new books can be downloaded from the JEOL USA website (jeolusa.com) under the Resources tab, or by clicking on http://tiny.cc/SEMAZ and http://tiny.cc/QASEM. They are a useful resource for ...


JEOL to Remotely Demonstrate New High Throughput, Ultrahigh Resolution Analytical FE SEM at Semicon West 2009
June 30, 2009 (Peabody, Mass.) -- JEOL, a leading supplier of electron microscopes for ultrahigh resolution imaging and analysis, will demonstrate its new ultrahigh resolution, analytical Thermal Field Emission Scanning Electron Microscope (SEM), the JSM-7600F, via live remote viewing and control from Semicon West, San Francisco, July 14-16. The SEM will be remotely operated from JEOL’s booth #606 to demonstrate ultrahigh imaging resolution at up to 1,000,000X magnification, and X-ray analytical mapping of individual layers, ...


West Virginia University Advancing Nanoscience with New E-beam SEM
The city of Morgantown, West Virginia, home to West Virginia University, is making national headlines as an “economic oasis.” It is one of the few U.S. locations to be successfully isolated from the current recession, offering diverse opportunities for employment and research plus a low cost of living. Isolation of another kind is occurring in the University’s Nanosystems Engineering Shared Cleanroom (NESC), where Dr. Kolin Brown is installing a new e-beam lithography/scanning electron microscope (SEM). ...


Shale and Solar Thin Film Cross Sectioning Demonstrated in New E-Brochure
May 8, 2009, Peabody, Mass. -- A new e-brochure from JEOL illustrates the application of an ion beam cross section polisher for SEM sample preparation of solar panel thin films and kerogen-rich shale samples. The online brochure includes SEM images as well as movie and 3D files of complex shale composites and EBSD orientation maps of solar panel thin films. The JEOL cross section polisher produces cross sections without smearing, crumbling, or distortion - ...