FOR IMMEDIATE RELEASE
Patricia Corkum, Marketing Manager
978-536-2273 • firstname.lastname@example.org • www.jeolusa.com
(March 1, 2017 Peabody, Mass.) -- A new FilterSpray™ module developed for the AccuTOF-DART Mass Spectrometer makes it possible to spot a sample on a disposable paper triangle for analysis by ambient ionization. The optional module is a simple alternative to Electrospray Ionization that eliminates the need for a special pump or plumbing, spray needle, desolvating gas, or precise alignment. The FilterSpray module is easily mounted onto the linear rail of the AccuTOF-DART, to permit FilterSpray analysis on the sample platform. Samples and solvent are deposited onto a paper triangles cut from a porous substrate such as filter paper or chromatography paper.
Typical applications for FilterSpray analysis include: polar and highly charged compounds, cationic and anionic compounds, thermally labile compounds, polymers, inorganic compounds and metals, peptides, digests, and small proteins. Samples can be analyzed without the risk of cross-contamination and sample carryover.
Because the AccuTOF does not require any additional interface hardware for use with the DART, a variety of ambient ionization techniques are available to the AccuTOF-DART operator without removing the DART ion source.The third-generation AccuTOF-DART 4G system is an “ambient ionization toolbox” that allows the analyst to choose ionization methods that are best matched to the samples to be analyzed.
JEOL introduced the AccuTOF-DART in 2005 as the first commercially available ambient ionization mass spectrometer system. The atmospheric pressure ionization interface (API) for the AccuTOF system, originally designed as a simple, rugged and reliable LC/MS interface, became the ideal platform for developing the Direct Analysis in Real Time (DART) ion source.
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JEOL USA, Inc.
JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.
JEOL USA, Inc., is a wholly owned subsidiary of JEOL, Ltd., Japan, was incorporated in the United States in 1962. The company has 13 regional service centers that offer unlimited emergency service and support in the U.S.
For more information about JEOL USA, Inc. or any JEOL products, visit www.jeolusa.com, or call 978-535-5900.