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JEOL USA Press Releases


JEOL Demonstrates New Analytical Technology at Pittcon 2016

March 7, 2016 (Pittcon 2016, Atlanta GA) -- JEOL USA (Booth #2857) will unveil several new analytical technologies during Pittcon 2016 in Atlanta, Georgia. With a comprehensive line of time-of-flight mass spectrometers, high resolution scanning (SEM) and transmission (TEM) electron microscopes, and the latest in 2-channel and digital/high frequency Nuclear Magnetic Resonance Spectrometry, JEOL helps advance imaging and analytical capabilities across a wide range of scientific research.

Real-time gas analysis with InfiTOF
JEOL will debut the InfiTOF, a compact high-resolution mass spectrometer designed for real-time gas analysis. The InfiTOF’s unique multi-turn ion optics provide high-resolution mass spectra in a system that is the size of a personal computer tower. | more...

New Photoionization (PI) source for hydrocarbon analysis
A new combination electron ionization/photoionization (EI/PI) source for JEOL’s fourth-generation AccuTOF-GCX high-resolution time-of-flight mass spectrometer. Photoionization is a soft ionization method that provides molecular weight information with minimal fragmentation. It very sensitive for certain environmentally-important compound classes such as polycyclic aromatic hydrocarbons (PAHs). | more...

AccuTOFTM-DART® with ionRocket
The AccuTOF-DART will be demonstrated with a new ionRocket thermal desorption and pyrolysis system (Biochromato, Inc.). The AccuTOF-DART is virtually an “ambient ionization toolbox” that can carry out a range of techniques without having to change any hardware or remove the DART ion source. The AccuTOF-DART produces clean, reproducible, easy-to-interpret data. JEOL introduced the revolutionary DART® ion source at Pittcon 2005, and received the Pittcon Editors Gold Award. | more...

Analytical SEM for the benchtop
Nikon will be in the JEOL booth to demonstrate the JSM-6000Plus, the third generation of the popular NeoScope. The NeoScope delivers fast, high magnification electron microscopy with more functionality than typical benchtop SEMs. The JSM-6000Plus model offers high sensitivity backscatter electron detection with a JEOL BSE detector to detect contrast between areas of the sample with different chemical compositions. | more...

Versatile SEM with Multiple Analytical Techniques
JEOL will demonstrate its high resolution analytical Scanning Electron Microscope, the JSM-IT300LV Scanning Electron Microscope. A highly-customizable SEM, the JSM-IT300LV features smart analytical port geometry for multiple configurations allowing simultaneous analysis techniques. This high throughput SEM features a large sample chamber for non-destructive imaging and analysis and intuitive touch screen operation. | more...

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JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.

JEOL USA, Inc., is a wholly owned subsidiary of JEOL, Ltd., Japan, was incorporated in the United States in 1962. The company has 13 regional service centers that offer unlimited emergency service and support in the U.S.

For more information about JEOL USA, Inc. or any JEOL products, visit www.jeolusa.com, or call 978-535-5900.