JEOL USA Exhibiting Imaging Solutions at APEX 2007
January 16, 2007, Peabody, MA -- For the first time in its 50+ year history, JEOL USA will be exhibiting at the IPC Printed Circuits Expo/APEX (February 18-22, 2007, Los Angeles, CA). JEOL USA will showcase an argon ion beam cross section polisher (CP) for specimen preparation prior to high magnification imaging with the scanning electron microscope (SEM).
The JEOL CP produces precise cross sections of both soft and hard materials, as well as composites. ...