JEOL USA Press Releases

New DART SVP Source and iDART Automation Streamline JEOL AccuTOF-DART™ Time-of-Flight Mass Spectrometer Performance

January 21, 2010, Peabody, Mass. -- JEOL’s award-winning AccuTOF-DART™ mass spectrometer, featuring the new iPod touch-enabled DART SVP ion source, offers a new set of performance features for accurate mass measurements in real time using advanced time-of-flight technology. JEOL introduced the Direct Analysis in Real Time (DART™) ion source in 2005 for its AccuTOF-LC mass spectrometer, expanding the system’s capability with the first commercially-available open air analysis source that produced immediate, accurate mass spectra with ...
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