Get the big picture from a small, compact, and versatile Benchtop SEM
Introducing the JCM-6000PLUS NeoScope from JEOL
JEOL USA, Peabody, MA (October 6, 2015) --- JEOL's benchtop SEM makes it possible to bring basic high resolution imaging and analysis features of a full-sized Scanning Electron Microscope into the lab. It fits into both small spaces and economical budgets, and its simple operation and versatile functions complement the workflow with optical microscopes or larger SEMs.
With recent upgrades, JEOL has introduced a new model, the JCM-6000Plus, the third ...