JEOL USA Press Releases

November 28, 2006 (Peabody, Mass.) -- JEOL USA Inc. today announced that the DART™ (Direct Analysis in Real Time) technology for open-air mass spectrometry has been awarded U.S. Patent No. 7,112,785 by the U.S. Patent and Trademark office. The patent covers the method of ionization of the DART process. This is the second U.S. patent covering the DART device and technology. The first patent was awarded in September 2005. The award-winning DART was commercially introduced ...

November 9, 2006 (Peabody, Mass.) -- JEOL USA introduces the latest in imaging technology and microscopy automation with its new 120 kV high resolution Transmission Electron Microscope (TEM). This versatile instrument, the model JEM-1400, is optimized for biological, polymer, and materials research, combining both imaging and cryomicroscopy excellence. High contrast resolution is assured at 0.38nm point-to-point and 0.2nm lattice images. The TEM can be quickly configured for either high contrast imaging or scanning transmission electron ...

November 9, 2006 (Peabody, Mass.) -- JEOL USA announced that it will deliver the first of its new 120kV Transmission Electron Microscopes (TEMs) to Georgia Institute of Technology in January 2007. The JEOL JEM-1400 is a versatile, compact TEM, optimized for biological, polymer, and materials research and designed for Cryo-EM applications. The TEM will be in operation at Georgia Tech’s School of Biology in the Cherry Emerson Building until it can be moved to the ...