NEW Versatile High Throughput SEM from JEOL
Portland, OR - November 4, 2015 -- JEOL's new JSM-IT100 is the latest addition to its InTouchScope Series of Scanning Electron Microscopes. Representing 50 years of industry leadership with advances in SEM, the IT100 is a simple-to-use versatile, research-grade SEM with a compact ergonomic design.
Featuring expanded EDS analysis capabilities and ports for multiple detectors, the InTouchScope is a versatile workhorse SEM that can be configured to meet individual lab requirements at an exceptional value. ...