High Throughput Serial Block Face Imaging with JEOL FE SEM and Gatan 3View®
December 10, 2013 (Peabody, Mass.) -- JEOL, Ltd., a world leader in electron microscopy, has announced a joint initiative between JEOL and Gatan that brings the power of Serial Block Face imaging to the JEOL family of scanning electron microscopes. Researchers will be able to image 3D structures of biological and materials samples at ultrahigh resolution using the JEOL JSM-7100F Field Emission Scanning Electron Microscope with an integrated Gatan 3View® Serial Block Face Imaging ...