JEOL USA Press Releases

JEOL, renowned for its expertise in the manufacture and applications support of scientific instrumentation for sixty years, has produced a new brochure for 2009 describing electron microscopy and mass spectrometry solutions for forensic science. The brochure includes helpful links to applications notes using Direct Analysis in Real Time (DART) open air mass spectrometry, and links to profiles of real case studies involving the use of JEOL Scanning Electron Microscopes (SEM). Demonstrations at American Academy of Forensic ...

February3, 2009 (Peabody, Mass.) -- JEOL USA is pleased to offer the latest tomography solutions for transmission electron microscopy (TEM). Tomography, or three-dimensional (3D) reconstruction of multiple TEM images, has developed in the past decade as one of the more important applications in the field of life sciences and, more recently, in the field of materials science. Through its applications group, JEOL USA offers support for tomography comprised of three software packages: SerialEM and IMOD, ...