JEOL USA Press Releases

Peabody, Mass., March 17, 2006 -- A new applications notebook from JEOL USA comprises more than 25 recent applications notes resulting from analyses using the AccuTOF™ DART™ (Direct Analysis in Real Time) mass spectrometer. The broad range of applications in this second volume of notes published since the introduction of DART includes pharmaceuticals, foods, industrial products, forensic evidence, and biological fluids analyzed without sample preparation. Samples are analyzed in open air using the DART ion source, ...

Peabody, Mass., March 9, 2006 -- A new single-column focused ion beam (FIB) system from JEOL makes automated, high-speed specimen preparation affordable at nearly one-third the cost of dual beam FIBs. The JEOL JEM-9320 FIB prepares thin films and cross sections for failure and defect analysis at the nanoscale using S/TEM, TEM or surface observation. An ion beam current of 30nA at 30kV delivers fast, automated precise milling of specimens, which can be observed in ...