JEOL USA Press Releases

JEOL Unveils Highest Resolution 200kV Aberration-corrected Scanning/Transmission Electron Microscope (S/TEM)

Peabody, Mass., March 10, 2009 – The year 2009 marks the introduction of a new generation of Transmission Electron Microscope (TEM) for JEOL, as well as the 60th anniversary of the company with the longest history of innovation and leadership in electron microscopy. JEOL is pleased to introduce the new JEM-ARM200F atomic resolution analytical microscope. Highest Resolution Commercially Available According to JEOL USA, the company’s U.S. subsidiary, JEOL has unveiled its new JEM-ARM200F atomic resolution analytical ...

JEOL USA and the College of Microscopy Increase Collaborative Efforts to Improve Microscopy Education

PITTCON, Chicago, Ill.—JEOL USA, renowned for its expertise as a leading supplier of electron microscopes for research and industrial problem solving, and the College of Microscopy, the education division of The McCrone Group, are proud to announce an increased partnership and joint commitment to improving the study of microscopy. JEOL USA will provide a new JSM-6610LV low vacuum high-performance Scanning Electron Microscope (SEM) to the College of Microscopy for use in basic and advanced training ...

JEOL Introduces Highest Sensitivity GC-TOF Mass Spectrometer

Peabody, Mass., March 6, 2009 -- The new AccuTOF-GCv from JEOL features the highest sensitivity of any GC time-of-flight mass spectrometer commercially available. By combining rapid data acquisition speeds with high resolution and a high dynamic range, the AccuTOF-GCv delivers exact mass measurements for both qualitative and quantitative analysis. The new AccuTOF-GCv introduces several new software features including automatic ion source tuning, automatic drift calibration, automatic data file conversion and export. The Tuning Assistant function ...

JEOL Marks 60th Anniversary at Pittcon 2009

Peabody, Mass., March 5, 2009 -- JEOL, renowned for its role in the development and manufacture of advanced electron microscopy and spectroscopy products since 1949, kicks off its 60th anniversary celebration at Pittcon (Chicago, March 8-13, 2009), the premier conference and exposition on laboratory sciences. Pittcon, also celebrating its 60th anniversary, is known for being the exhibition where companies debut their latest products and technology. JEOL USA will introduce new microscopy and spectrometry instrumentation, as ...
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