JEOL USA Press Releases

Nanoscience owes much to the discoveries of world renowned physicist Dr. Sumio Iijima, who pioneered the use of high resolution transmission electron microscopy (HRTEM) to characterize nanomaterials in the early 70s and successfully imaged carbon nanotubes in the early 90s. Although he has used JEOL TEMs for the past four decades, Dr. Iijima visited JEOL USA this March for the first time following a speaking engagement at MIT’s Center for Materials Science and Engineering. Dr. Iijima’s ...

March 18, 2010, Peabody, Mass. -- JEOL USA and the University of Texas at Dallas (UTD) today jointly announced the University’s acquisition of the new JEOL atomic resolution Transmission Electron Microscope (TEM). The new ARM200F is an aberration-corrected TEM that achieves better than 1 Angstrom resolution in STEM and TEM and chemical analysis at the atomic level. The announcement was made during a JEOL USA “Nano and Beyond” electron microscopy seminar held in the University’s ...