JEOL USA Press Releases

JEOL Introduces New Versatile FE-SEM Series for Sub-Nanometer Imaging and Analysis of Nanostructures and Magnetic Samples

April 17, 2012 (Peabody, Mass.) -- JEOL launches a new series of Field Emission Scanning Electron Microscopes (FE-SEM) that offer expanded imaging and analysis capabilities customizable to performance requirements. The JEOL JSM-7100F series offers sub-1 nm imaging capabilities and analytical characterization at the sub-100nm scale, accomplished through the combination of large beam currents with a small probe size at any accelerating voltage. Designed for the budget-conscious lab, the JSM-7100F model is a highly versatile, easy-to-use ...

JEOL Resonance Introduces Worlds' Fastest and Smallest Solid State NMR Probe

110kHz Magic Angle Spinning, a record for spinning speed with JEOL Resonance’s new 0.75 mm Solid State NMR Probe April 11, 2012 (Miami, Florida) -- JEOL Resonance, Inc., headquartered in Akishima, Tokyo, will announce a new 0.75 mm solid state NMR probe at the 53rd Experimental Nuclear Magnetic Resonance Conference that opens on April 15, 2012 in Miami, Florida. The probe is capable of high resolution sample analysis by spinning the sample at 110 kHz, ...
© Copyright 2024 by JEOL USA, Inc.
Terms of Use
|
Privacy Policy
|
Cookie Preferences