JEOL USA Press Releases

New JEOL Stage Navigation System for SEM and EPMA

May 31, 2011 (Peabody, MA) -- JEOL offers a new point-and-shoot navigation system that makes finding precise locations on a sample both fast and easy for SEM and EPMA users. The Stage Navigation System combines Stage Navigation Software with an externally-mounted 3 Megapixel CMOS color digital Stage Navigation Camera that functions as a low magnification optical microscope. The external camera eliminates the need for a dedicated port on the electron column. The user simply ...

JEOL "Flash & Go"™ Speeds Operation of ARM200F Cold FEG Transmission Electron Microscope

JEOL's atomic resolution Transmission Electron Microscope (TEM), the JEM-ARM200F, sets a new standard for rapidly resuming operation after flashing, a routine procedure conducted with any TEM featuring a Cold FEG source. Long considered a tradeoff for the higher resolution, higher brightness, and smaller energy spread of a cold FEG TEM, emission stability degrades due to residual gases in the area of the tip. With conventional cold FEG TEMs, the operator must flash every few ...
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