JEOL Introduces Ultra-high Resolution Analytical Field Emission SEM
May 31, 2012 (Peabody, Mass.) -- JEOL's new series of field emission scanning electron microscopes is now complete with the introduction of the sub-nanometer imaging resolution JSM-7800F. The JSM-7800F represents a significant leap forward in Field Emission SEM technology, with unmatched resolution and stability for nanotechnology imaging and analysis.
JEOL's highest performance FE-SEM makes it possible to:
observe the finest structural morphology of nanomaterials at 1,000,000X magnification with sub-1nm resolution
perform low kV imaging and analysis of ...