New JEOL JSM-IT300HR InTouchScope™ SEM
Ultrahigh resolution imaging of large samples in their native state
May 11, 2017 -- Peabody, MA JEOL USA introduces a new Scanning Electron Microscope (SEM) that combines the performance of a Field Emission SEM with the simplicity of the JEOL InTouchScope SEM series. The new JSM-IT300HR features exceptional image fidelity at any kV with a high brightness, long life emitter.
Offering higher resolution and magnification than ever before in this series, the IT300HR greatly enhances surface ...