JEOL Highlights New Analytical Technologies at ASMS 2016
June 2, 2016 (Peabody, Mass.) -- JEOL USA will unveil several new analytical technologies during ASMS 2016 in San Antonio, Texas (Booth #229). With a comprehensive line of time-of-flight mass spectrometers, JEOL advances analytical capabilities for a wide range of scientific research.
JEOL and the company's mass spectrometry customers will present several posters at ASMS. In particular, one oral presentation by collaborators at University at Albany will detail the use of AccuTOF-DART for "Classification of ...