JEOL USA Press Releases

July 20, 2010 (Peabody, Mass.) -- JEOL USA is pleased to announce that a new Cold Field Emission Gun is now available for the atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM). The ARM200F, introduced in 2009, has set a new benchmark for advanced aberration-corrected S/TEM technology with the highest resolution commercially available in its class. Now outfitted with the optional and field-retrofittable Cold FEG, the ARM200F’s ultrahigh imaging resolution is guaranteed at 78 picometers ...

July 13, 2010 (Peabody, Mass.) – This August, JEOL USA will demonstrate the first correlative microscope to enable concurrent light microscopy and atmospheric scanning electron microscopy (ASEM) for observation of and experimentation on samples in their native state. The new JEOL ClairScope will make its debut in the United States at Microscopy & Microanalysis (M&M) in Portland, Oregon August 2-5, 2010, just prior to installation at Northwestern University’s Biological Imaging Facility where it will ...