JEOL USA Press Releases

New SpiralTOF™ MALDI TOF Applications Notebook Available from JEOL

July 26, 2012 (Peabody, Mass.) – A new Applications Notebook from JEOL features over 20 application notes describing the analysis of synthetic polymers, small organic molecules, complex drug mixtures, peptides, and proteins using the JEOL SpiralTOFTM MALDI TOF-TOF mass spectrometer. The SpiralTOF time-of-flight optics design utilizes a figure-eight ion trajectory to allow a 17m flight path to fit in an extremely small console. This exceptionally long flight path results in an ultrahigh resolving power ...

JEOL Puts a New Spin on its Benchtop SEM - NeoScope

July 10, 2012 (Semicon West, San Francisco, CA) -- Since its initial introduction in 2008, the JEOL NeoScope benchtop Scanning Electron Microscope (SEM), represented by Nikon Instruments, has been used for inspection of electronic parts, forensics analysis, pharmaceutical inspection, and imaging insects for student projects. It is also used in conjunction with both optical microscopes and traditional SEMs in the lab. Now JEOL introduces the NeoScope with higher magnification, multi-touch screen control, and a sleek ...
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