JEOL USA Press Releases

August 25, 2010 (Peabody, Mass.) -- JEOL has introduced a unique Scanning Electron Microscope with optics that enable ultrahigh resolution imaging at low kV and high spatial resolution microanalysis. The Through-the-Lens System (TTLS) combines new objective lens and detector technologies with the proven JEOL in-lens Field Emission Gun. The TTLS is designed to enable imaging of a wide variety of samples, including magnetic materials. The model JSM-7001FTTLS LV also features low vacuum operation and ...

August 18, 2010 (Peabody, Mass.) -- The ability to examine biological samples with both electron microscopy and light microscopy using a single instrument and switching between the two with a single mouse click is garnering top honors for the JEOL ClairScope. In August, the editors of Microscopy Today magazine selected the ClairScope for the MT-10 award, which recognizes ten microscopy innovations that make imaging and analysis more powerful, more flexible, more productive, and easier to ...

August 18, 2010 (Peabody, Mass.) -- Called the silent killer, ovarian cancer is one of the most insidious and hardest to detect diseases. It is the leading cause of death from gynecologic cancers in the United States and, because it presents no obvious symptoms, it is often detected too late. Researchers at Georgia Institute of Technology reported last week that a new test for ovarian cancer was demonstrated to be 99% to 100% accurate over ...