JEOL TEM Specialist to Serve as Visiting Scientist at Lehigh University
With just the right touch for fine tuning the optics of ultrahigh resolution microscopes, JEOL Applications Specialist Dr. Toshi Aoki is helping customers optimize the powerful imaging and analysis capabilities of their JEOL field emission TEMs. Starting in September, he will also serve as Visiting Scientist at Lehigh University, with opportunities to co-publish on new discoveries while putting the 200 keV FE TEM with Cs STEM corrector through its paces.
High resolution microscopy has fascinated ...