JEOL USA Press Releases

September 21, 2010 (Peabody, Mass.) -- JEOL offers a whole new electron microscope experience with the introduction of the InTouch Scope™, an analytical, low vacuum Scanning Electron Microscope (SEM) featuring integrated Energy Dispersive Spectroscopy (EDS) with the latest Silicon Drift Detector (SDD) technology. The new InTouch Scope has the familiar feel of today’s personal electronic media. The intuitive multi-touch screen interface puts all SEM “Apps” at the operator’s fingertips. The user can expand windows and ...

September 20, 2010 (Peabody, MA) -- JEOL announces a major order for the company's atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM), from the National Institute of Standards and Technology (NIST). The purchase was made through a competitive award process and funded by the American Recovery and Reinvestment Act. The TEM will be a featured instrument in the NIST Precision Measurement Laboratory, Boulder, Colorado. "We are very excited to be partnering with this premier Federal ...

August 31, 2010 (Peabody, Mass.) -- JEOL USA, a leading supplier of high resolution Transmission Electron Microscopes (TEMs) for biological and materials research, announces that Emory University in Atlanta, Georgia, has selected two JEOL TEMs for the Robert P. Apkarian Integrated Electron Microscopy Core (RPAIEMC). The two TEMs, one operating at 120kV and the other at 200kV, will be used in Life and Soft Materials Sciences research. As such, the instruments are equipped for imaging ...