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JEOL USA Press Releases

JEOL Debuts InfiTOF Multi-Turn Time-of-Flight Mass Spectrometer for Real-time Gas Analysis

posted on March 07, 2016
March 7, 2016 (Pittcon 2016, Atlanta, GA) -- At Pittcon 2016 (booth #2857), JEOL will debut the new InfiTOF, a compact high-resolution mass spectromet...

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New PhotoIonization (PI) Source and a new Application for JEOL’s Fourth-Generation AccuTOF-GCX High-Resolution GC/Time-of-Flight Mass Spectrometer

posted on March 07, 2016
March 7, 2016 (Pittcon 2016, Atlanta, GA) – JEOL introduces a new combination electron ionization/photoionization (EI/PI) source for JEOL’...

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Powerful Problem-solving Mass Spectrometer Demonstrations at Pittcon 2016 - JEOL AccuTOF-DART 4G

posted on March 07, 2016
March 7, 2016 (Pittcon 2016, Atlanta, GA) -- At Pittcon 2016 (Booth #2857) JEOL will demonstrate the latest features of the game-changing open air amb...

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Big Picture Plus Analysis from a Small, Compact, and Versatile Benchtop SEM - The JSM-6000PLUS NeoScope from JEOL

posted on March 07, 2016
March 7, 2016 (Pittcon 2016, Atlanta, Georgia) --- JEOL introduces a new benchtop SEM at Pittcon 2016: the JSM-6000Plus, the third generation of the ...

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JEOL Tungsten SEM with Smart Analytical Port Geometry Demonstrated at Pittcon 2016

posted on March 07, 2016
March 7, 2016 (Pittcon 2016 Atlanta, GA) -- JEOL will demonstrate its high resolution analytical Scanning Electron Microscope in Booth #2857 during th...

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Researchers first to prove ZIKA Virus associated with Microcephaly Used JEOL Transmission Electron Microscopes (TEM) for imaging brain sections

posted on February 22, 2016
Scientists from the Institute of Microbiology and Immunology and the Institute of Pathology in Ljubljana, Slovenia are the first in the world to publi...

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New JEOL "F2" Versatile S/TEM Offers Advanced Analytical Features

posted on February 03, 2016
(February 3, 2016 -- Peabody, MA) -- JEOL's most recent addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, or "F2,"...

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JEOL USA Announces Grand Prize winners for 2015 SEM & TEM Image Contest

posted on January 14, 2016

Demonstrates excellent technical skills with Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM).

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NEW Versatile High Throughput SEM from JEOL

posted on November 04, 2015
Simple-to-use versatile, research-grade SEM

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Get the big picture from a small, compact, and versatile Benchtop SEM

posted on October 06, 2015

Introducing the JCM-6000PLUS NeoScope from JEOL

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