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JEOL USA Press Releases

JEOL Introduces New Best-in-Class Field Emission SEM

posted on September 03, 2015
September 1, 2015, Peabody, MA -- JEOL USA has introduced a new entry-level, high-performance Field Emission Scanning Electron Microscope, demonstrate...

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JEOL Brasil Sponsors LNNano Transmission Electron Microscopy Summer School

posted on August 20, 2015
August 20, 2015 (Peabody, MA and Sao Paulo, Brazil) --- JEOL BRASIL Instrumentos Científicos Ltda. is proud to sponsor the 6th biannual Transmi...

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Pollen Prevails as JEOL Names Spring Image Contest Winners

posted on June 16, 2015
Pollen season 2015 has been one of the worst, but also produced two of the best micrographs that recently won the monthly JEOL Electron Microscope Contest held for the second year in a row.

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New JEOL E-Beam Lithography System to Enhance Quantum NanoFab Capabilities

posted on May 06, 2015

cutting-edge facilities at the University of Waterloo Quantum NanoFab in Waterloo, Ontario

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JEOL Unveils 4th Generation GCxGC Mass Spectrometer with Powerful Data Analysis Software at Pittcon 2015

posted on March 09, 2015
designed for optimum throughput, operation, and uptime

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JEOL Celebrates 10 year anniversary of Direct Analysis in Real Time and Introduces New AccuTOF-DART 4G

posted on March 09, 2015
enhanced resolution, speed, and accuracy in a rugged, flexible, versatile design

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New Method for Trace Detection of Explosives from Fingerprints Uses Nanoextraction and Open Air Analysis

posted on February 20, 2015
allows very high precision analysis

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JEOL and UC Irvine Partner to Develop Premier Electron Microscopy and Materials Research Center

posted on January 13, 2015
Strategic partnership to create a premier electron microscopy and materials science research facility.

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JEOL USA Console Replacement Offer to NMR Users

posted on December 15, 2014
December 15, 2014 (Peabody, MA) -- JEOL USA is pleased to announce a new program that, for a limited time, offers NMR users in the Americas the opport...

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JEOL Announces New EDXRF for Wide Range of Sample Types

posted on October 07, 2014
Easy-to-use, smart solution for high-sensitivity elemental analysis in a new benchtop EDXRF spectrometer

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