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JEOL USA Press Releases

JEOL Reinvents Time-of-Flight Mass Spectrometry with Innovative SpiralTOF™ MALDI-TOF System

posted on May 21, 2010
Reinvents Time-of-Flight ion optics with an extended flight length in a compact footprint.

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JEOL Offers First Commercially-Available Thin Film Phase Plate Technology for TEM

posted on April 06, 2010

Multifold Increase in Biological Specimen Imaging Contrast

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Award-winning Pioneer in Nanoscience Research Visits JEOL USA

posted on March 29, 2010

Nanoscience owes much to the discoveries of world renowned physicist Dr. Sumio Iijima

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UT Dallas Re-energizes Semiconductor Nano Research with Acquisition of New JEOL Atomic Resolution Microscope

posted on March 18, 2010

UT Dallas advances its role as key contributor to the development of next-generation semiconductor devices

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First JEOL JEM-ARM200F Electron Microscope Produces Atomic Resolution Data in Record Time at University of San Antonio

posted on February 18, 2010

Demonstrates the stability of this all-new instrument and the skill of the UTSA-JEOL team to quickly power up the first TEM of its kind.

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New JEOL Microprobe Helps Advance Research Opportunities for Students and Industry in North Carolina

posted on February 08, 2010

Will expand research and educational opportunities for students, faculty, and industry in southeastern North Carolina.

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New DART SVP Source and iDART Automation Streamline JEOL AccuTOF-DART™ Time-of-Flight Mass Spectrometer Performance

posted on January 21, 2010

Offers a new set of performance features for accurate mass measurements in real time using advanced time-of-flight technology.

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JEOL Cryo-TEM to Enable New Structural Biology Research at University of Texas El Paso

posted on December 16, 2009

Will provide capabilities to establish world class facility at UTEP

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JEOL Canada Increases Sales Support for Scientific Instrumentation

posted on December 03, 2009

Appointments of new sales manager and customer service representative

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JEOL to Remotely Demonstrate New High Throughput, Ultrahigh Resolution Analytical FE SEM at Semicon West 2009

posted on July 01, 2009

SEM will be remotely operated from JEOL’s booth #606 to demonstrate ultrahigh imaging resolution at up to 1,000,000X magnification, and X-ray analytical mapping of individual layers, elemental composition, contaminants, particulates, and process defects in semiconductor devices.

( read this press release… )

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