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JEOL USA Press Releases

Unique Mass Spectrometer for Analysis of Semiconductor Process Gases

posted on June 15, 2017
June 15, 2017, Peabody, Mass. -- The JEOL InfiTOF compact high-resolution gas analysis mass spectrometer is ideal for monitoring trace impurities in s...

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JEOL Announces New Field Emission Scanning Electron Microscope

posted on June 01, 2017

Highest quality data and easiest operation

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JEOL Introduces World's Fastest Direct Write E-Beam Tool

posted on May 16, 2017
May 16, 2017 (Peabody, Mass.) -- Since 1967, JEOL has been the industry leader in Electron Beam Lithography design and manufacturing. Now the company ...

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New JEOL JSM-IT300HR InTouchScope™ SEM

posted on May 11, 2017

Ultrahigh resolution imaging of large samples in their native state

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JEOL RESONANCE and Mestrelab Research S.L., announce technology partnership for qNMR market - qNMR seamless

posted on April 27, 2017

fully automated signal acquisition and qNMR analysis capability

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New Field Emission Cryo-Electron Microscope JEM-Z200FSC

posted on April 27, 2017

automatically acquires image data for Single Particle Analysis over a long period of time

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JEOL Exhibits InTouchScope SEM and Cross Section Polishing Abilities at Ceramics Expo

posted on April 25, 2017
(April 25, 2017, Peabody, Mass.) JEOL, a global leader in scanning electron microscopy (SEM) for imaging and analysis, will exhibit its popular InTouc...

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New FilterSpray™ Ionization Module Expands Analytical Capabilities of AccuTOFTM-DART®, the "Ambient Ionization Toolbox" Mass Spectrometer

posted on March 01, 2017

Makes it possible to spot a sample on a disposable paper triangle for analysis by ambient ionization

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New JEOL NMR Probe for Fluorinated Compounds

posted on March 01, 2017

New level of flexibility for NMR analysis of fluorinated compounds prevalent in many new pharmaceutical products

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JEOL Highlights New Analytical Technologies at ASMS 2016

posted on June 02, 2016
advances analytical capabilities for a wide range of scientific research

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