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JEOL USA Press Releases

New FilterSpray™ Ionization Module Expands Analytical Capabilities of AccuTOFTM-DART®, the "Ambient Ionization Toolbox" Mass Spectrometer

posted on March 01, 2017

Makes it possible to spot a sample on a disposable paper triangle for analysis by ambient ionization

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New JEOL NMR Probe for Fluorinated Compounds

posted on March 01, 2017

New level of flexibility for NMR analysis of fluorinated compounds prevalent in many new pharmaceutical products

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JEOL Highlights New Analytical Technologies at ASMS 2016

posted on June 02, 2016
advances analytical capabilities for a wide range of scientific research

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JEOL Founders Recognized with Pittcon Heritage Award

posted on March 25, 2016
March 24, 2016 Peabody, MA -- JEOL is honored to announce that the company founders were recognized for their scientific vision and pioneering leaders...

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JEOL Demonstrates New Analytical Technology at Pittcon 2016

posted on March 07, 2016
March 7, 2016 (Pittcon 2016, Atlanta GA) -- JEOL USA (Booth #2857) will unveil several new analytical technologies during Pittcon 2016 in Atlanta, Geo...

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JEOL Debuts InfiTOF Multi-Turn Time-of-Flight Mass Spectrometer for Real-time Gas Analysis

posted on March 07, 2016
March 7, 2016 (Pittcon 2016, Atlanta, GA) -- At Pittcon 2016 (booth #2857), JEOL will debut the new InfiTOF, a compact high-resolution mass spectromet...

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New PhotoIonization (PI) Source and a new Application for JEOL’s Fourth-Generation AccuTOF-GCX High-Resolution GC/Time-of-Flight Mass Spectrometer

posted on March 07, 2016
March 7, 2016 (Pittcon 2016, Atlanta, GA) – JEOL introduces a new combination electron ionization/photoionization (EI/PI) source for JEOL’...

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Powerful Problem-solving Mass Spectrometer Demonstrations at Pittcon 2016 - JEOL AccuTOF-DART 4G

posted on March 07, 2016
March 7, 2016 (Pittcon 2016, Atlanta, GA) -- At Pittcon 2016 (Booth #2857) JEOL will demonstrate the latest features of the game-changing open air amb...

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Big Picture Plus Analysis from a Small, Compact, and Versatile Benchtop SEM - The JSM-6000PLUS NeoScope from JEOL

posted on March 07, 2016
March 7, 2016 (Pittcon 2016, Atlanta, Georgia) --- JEOL introduces a new benchtop SEM at Pittcon 2016: the JSM-6000Plus, the third generation of the ...

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JEOL Tungsten SEM with Smart Analytical Port Geometry Demonstrated at Pittcon 2016

posted on March 07, 2016
March 7, 2016 (Pittcon 2016 Atlanta, GA) -- JEOL will demonstrate its high resolution analytical Scanning Electron Microscope in Booth #2857 during th...

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