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JEOL USA Press Releases

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JEOL Introduces new IT500HR High Resolution SEM on opening day at M&M 2017
JEOL Introduces new IT500HR High Resolution SEM on opening day at M&M 2017
For further information, please visit https://www.jeol.co.jp/en/products/detail/JSM-IT500HR.html.


New Technical Note: Structure Elucidation of Fluorinated Compounds by NMR
August 1, 2017 (Peabody, Mass.) -- A new JEOL technical note, "Structure Elucidation of Fluorinated Compounds by NMR," describes the technology and applications of the new JEOL ROYAL HFX probe for Nuclear Magnetic Resonance (NMR) Spectroscopy. The JEOL ROYAL HFX NMR probe offers a new level of flexibility for NMR analysis of fluorinated compounds prevalent in wide variety of current products and many new products across a wide spectrum of industries. The paper is available for ...


Unique Mass Spectrometer for Analysis of Semiconductor Process Gases
June 15, 2017, Peabody, Mass. -- The JEOL InfiTOF compact high-resolution gas analysis mass spectrometer is ideal for monitoring trace impurities in semiconductor process gases, evolved gases from catalytic reactions, vapor epitaxy and more.  No larger than a desktop PC, the InfiTOF instantly separates isobaric gases such CO and N2, or N2O and CO2, for continuous monitoring without chromatography.  This Time-of-Flight Mass Spectrometer uses Multi-turn and Perfect focusing technologies to achieve high mass-resolving power in ...


JEOL Announces New Field Emission Scanning Electron Microscope
(June 1, 2017 - Peabody, Mass.) – JEOL USA, Inc. introduces its new premier Field Emission SEM, the JSM-7900F, a uniquely flexible platform that combines the ultimate in high resolution imaging with unparalleled nano scale microanalysis.  This tool excels in lightning fast data acquisition through simple and automated operation. Applications include imaging and analysis of metals, magnetic materials, semiconductors, ceramics, medical devices, and biological specimens. Advanced research and analysis requires ever more powerful capabilities in a flexible, ...


JEOL Introduces World's Fastest Direct Write E-Beam Tool
May 16, 2017 (Peabody, Mass.) -- Since 1967, JEOL has been the industry leader in Electron Beam Lithography design and manufacturing. Now the company enters its 51st year in this field with the introduction of a new high throughput spot beam direct write system, the JBX-8100FS. This new generation of e-beam introduces the capability of writing ultrafine patterns at a high rate of speed directly onto substrates with minimum idle time during the exposure process. ...


New JEOL JSM-IT300HR InTouchScope™ SEM
Ultrahigh resolution imaging of large samples in their native state May 11, 2017 -- Peabody, MA JEOL USA introduces a new Scanning Electron Microscope (SEM) that combines the performance of a Field Emission SEM with the simplicity of the JEOL InTouchScope SEM series. The new JSM-IT300HR features exceptional image fidelity at any kV with a high brightness, long life emitter. Offering higher resolution and magnification than ever before in this series, the IT300HR greatly enhances surface ...


JEOL RESONANCE and Mestrelab Research S.L., announce technology partnership for qNMR market - qNMR seamless
Tokyo (April 27, 2017) JEOL RESONANCE Inc. (hereafter "JEOL") and Mestrelab Research S.L.(hereafter "Mestrelab") announce a new technology partnership of significant interest to industrial and government institutions that perform work involving compound quantitation using NMR(qNMR). qNMR has been attracting considerable attention across a broad spectrum of chemical analytical laboratories, as it provides accurate quantitative information without the requirement of reference compounds or predetermined response factors for every analyte. qNMR can be applied for the evaluation of ...


New Field Emission Cryo-Electron Microscope JEM-Z200FSC
Tokyo (April 26, 2017) Cryo-electron microscopy has been established as a method to enable observation of cells and biological molecules with no fixation and no staining. Owing to the recent rapid progress of hardware and software, this microscopy technique has become increasingly important as an atomic-scale structural analysis method. In addition, technologies that enable analysis of membrane proteins without crystallization have been developed, resulting in increased use of cryo-electron microscopy for drug discovery. Thus, installation ...


JEOL Exhibits InTouchScope SEM and Cross Section Polishing Abilities at Ceramics Expo
(April 25, 2017, Peabody, Mass.) JEOL, a global leader in scanning electron microscopy (SEM) for imaging and analysis, will exhibit its popular InTouchScope series SEM at Ceramics Expo in Cleveland, OH on April 25-27. From surface observation to cross-section imaging and analysis, JEOL Scanning Electron Microscopes and ion beam polishers reveal structural and elemental details to ensure the quality and composition of materials. JEOL instruments make it possible to examine the inner structure and core ...


New FilterSpray™ Ionization Module Expands Analytical Capabilities of AccuTOFTM-DART®, the "Ambient Ionization Toolbox" Mass Spectrometer
(March 1, 2017 Peabody, Mass.) -- A new FilterSpray™ module developed for the AccuTOF-DART Mass Spectrometer makes it possible to spot a sample on a disposable paper triangle for analysis by ambient ionization. The optional module is a simple alternative to Electrospray Ionization that eliminates the need for a special pump or plumbing, spray needle, desolvating gas, or precise alignment. The FilterSpray module is easily mounted onto the linear rail of the AccuTOF-DART, to permit ...