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PRODUCTS
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       Electron Optics
          Scanning Electron Microscopes (SEM)
             High Vacuum/Low Vacuum
                JSM-6510
                JSM-6510LV
                JSM-6610
                JSM-6610LV
                JCM-5700 CarryScope™
                NeoScope Benchtop SEM
             Conventional FE
                JSM-7001F
             Semi-in-Lens FE
                JSM-6701F
                JSM-7500F
                JSM-7600F
             Software
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             SEM-FIB
                JIB-4500 / MultiBeam
                JIB-4600F / MultiBeam
          Transmission Electron Microscopes (TEM)
             100/120 kV
                JEM-1011
                JEM-1400
             200 kV
                JEM-2100F
                JEM-2100 LaB6
                JEM-2200FS
                JEM-2500SE
                JEM-ARM200F
             300 kV
                JEM-3100F
                JEM-3200FS
                JEM-3200FSC
             Software
                Tomography Solution
                   Serial EM Tomography Software
                   IMOD Tomography Software
                   Chimera Visualization Software
                TEMography™
                Sirius™ Remote Software
                Automated Data Acquisition (JADAS)
                Archive Management System (JAMS)
                Practical Remote In Situ Microscopy (PRISM)
             Applications - Life Sciences
                JEM-2200FS with Phase Plate
          Scanning Probe Microscopes (SPM)
             JSPM-4500
             JSPM-5200
          Surface Analysis (SA)
             JAMP-9500F
             JXA-8230
             JXA-8530F
       Analytical Instruments
          Mass Spectrometers
             AccuTOF™ DART™
             AccuTOF™ GCv
             AccuTOF™ LC
             GCmate™ II
             MStation™
          Nuclear Magnetic Resonance
             New! ECS 400
                ECS 400 Console
                Actively Shielded 400 MHz Magnet
                High-Sensitivity Probe
                Delta™ Software / Cyber-Enabled NMR
             ECX
             ECA
             ECX / ECA Features
             Delta™ NMR Software
             Probes
             Magnets
             Sample Changers
          Electron Spin Resonance
             JES-FA100
             JES-FA200
             JES-FA300
       Semiconductor Equipment
          Electron Beam Lithography
             JBX-3050MV
             JBX-5500FS
             JBX-6300FS
             JBX-9300FS
          Wafer Inspection SEM
             JWS-2000
             JWS-3000
             JWS-7855S
             JFAS-7000BT Beam Tracer
             WM-7000
             WM-10
             WM-7
          Fine Process Inspection
             JFS-9855S
             JEM-9320FIB
             EMU-220/330
       Sample Preparation Equipment
          Cross Section Polisher
             e-Brochure
          Ion Slicer
          Vacuum Evaporator
          JEM-9320FIB
APPLICATIONS
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       REALab
          MVA Scientific Consultants
          Sappi Fine Paper North America
          University of New England
          University of Texas
          The Blue Man
          McCrone Associates
          Virginia Inst. of Marine Science
          San Joaquin Delta College
          Philadelphia Museum of Art
          Indiana University
       Chemistry
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SERVICE / SUPPORT
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