Expanded imaging and analysis capabilities customizable to performance requirements

 

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110kHz Magic Angle Spinning, a record for spinning speed with JEOL Resonance’s new 0.75 mm Solid State NMR Probe

 

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Toured the company's U.S. corporate office in Peabody, Massachusetts accompanied by the Consul of Economic Affairs

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Awarded to JEOL USA Mass Spectrometry Product Manager, Dr. Robert (Chip) Cody

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Direct support through JEOL service engineers, administrative, and sales personnel

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One of Chile’s largest and most respected distributors of scientific, medical, educational, and industrial tools and equipment

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For process and quality control of mass produced semiconductor and materials samples

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New generation of Energy Dispersive Spectrometer (EDS) for ultrafast, ultrasensitive collection of X-rays through analysis with its Scanning Transmission Electron Microscopes

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Controls room temperature without air turbulence, noise, or vibration

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One of the 100 most technologically significant products introduced into the marketplace over the past year

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New point-and-shoot navigation system that makes finding precise locations on a sample both fast and easy for SEM and EPMA users

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Sets new standard for rapidly resuming operation after flashing

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Development of next-generation NMR instrumentation

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Observation of cells in a water environment at a higher resolution than is possible in optical microscopy

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Highly flexible platform for both biological and materials applications

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JEOL puts SEM “Apps” at your fingertips

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Major order for the company's atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM)

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First biological Field Emission TEM in the state of Georgia; will establish Emory University as a unique center for biological imaging

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Combines new objective lens and detector technologies with the proven JEOL in-lens Field Emission Gun

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Top honors for the JEOL ClairScope

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New Paper Published in Epidemiology, Biomarkers, & Prevention Research

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 Imaging resolution guaranteed at 78 picometers with an energy resolution of 0.3 eV

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This August, JEOL USA will demonstrate the first correlative microscope to enable concurrent light microscopy and atmospheric scanning electron microscopy (ASEM) for observation of and experimentation on samples in their native state.

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Who says science isn’t fun?

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Reinvents Time-of-Flight ion optics with an extended flight length in a compact footprint

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Multifold Increase in Biological Specimen Imaging Contrast

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Nanoscience owes much to the discoveries of world renowned physicist Dr. Sumio Iijima

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UT Dallas advances its role as key contributor to the development of next-generation semiconductor devices

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Demonstrates the stability of this all-new instrument and the skill of the UTSA-JEOL team to quickly power up the first TEM of its kind.

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Will expand research and educational opportunities for students, faculty, and industry in southeastern North Carolina.

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Offers a new set of performance features for accurate mass measurements in real time using advanced time-of-flight technology.

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Will provide capabilities to establish world class facility at UTEP

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Appointments of new sales manager and customer service representative

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New ClairScope™ Combines Atmospheric Scanning Electron Microscope (ASEM) with Light Microscope

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JEOL Applications Specialist Dr. Toshi Aoki helping customers optimize the powerful imaging and analysis capabilities of their JEOL field emission TEMs.

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Two new publications explain theory and operation of the SEM for routine imaging and elemental analysis.

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SEM will be remotely operated from JEOL’s booth #606 to demonstrate ultrahigh imaging resolution at up to 1,000,000X magnification, and X-ray analytical mapping of individual layers, elemental composition, contaminants, particulates, and process defects in semiconductor devices.

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Analytical field emission SEM is part of the University’s vigorous WVNano Initiative

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Illustrates the application of an ion beam cross section polisher for SEM sample preparation of solar panel thin films and kerogen-rich shale samples

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Member of the JEOL sales organization for more than 25 years

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JEOL ARM200F to Be Delivered to FSU’s National High Magnetic Field Laboratory

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New benchmark for advanced, aberration-corrected S/TEM technology with the highest resolution commercially available in its class

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Internationally known for its state-of-the-art laboratories and work in small-particle identification and analysis, the College of Microscopy provides highly specialized training and continuing education for scientists, crime lab personnel, researchers, educators and technicians from around the world.

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Highest sensitivity of any GC time-of-flight mass spectrometer commercially available

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60th anniversary kicks off with celebration at Pittcon (Chicago, March 8-13, 2009), the premier conference and exposition on laboratory sciences

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Includes helpful links to applications notes using Direct Analysis in Real Time (DART) open air mass spectrometry, and links to profiles of real case studies involving the use of JEOL Scanning Electron Microscopes (SEM).

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Routine tomography acquisitions, processing and visualization of resin-embedded as well as beam-sensitive vitrified specimens.

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University of Washington Orders JEOL JBX-6300FS Direct Write E-Beam Lithography System for Microfabrication Lab

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Electron microscope leader JEOL USA hosted a special visit recently from renowned materials scientist Dr. Akihisa Inoue, President of Tohoku University in Sendai, Japan. Dr. Inoue’s research in a new class of bulk amorphous metals has made a major impact on subsequent research into new materials around the world.

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Detection of this chemical compound, which is being maliciously added to food products to make them appear to contain higher levels of protein, takes on a new urgency in a global market.

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A new “golden age” of breakthrough research anticipated

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interactive Technology Experience Center integrates technology with fun to promote engineering and science

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Sirius remote TEM operation

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Will demonstrate a new high throughput Thermal Field Emission (FEG) Scanning Electron Microscope (SEM), the JSM-7600F.

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Ongoing Demonstrations in JEOL’s Ion Beam Power Tools Booth at M&M 2008

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New Protochips heating holder to be remotely demonstrated on Oak Ridge National Labs Aberration-corrected JEOL TEM

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Live demonstrations and tutorials to be held at M&M 2008

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See the new JEOL lineup: Power Tools for Microscopy and Sample Processing

JEOL Wins 8th Omega Award for Service

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4th edition of the AccuTOF-DART applications notebook and the individual applications notes can be downloaded from the JEOL USA website

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Two of the world’s leading imaging equipment suppliers - Nikon Instruments and JEOL - have joined forces to bring a new benchtop SEM to the market.

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In a recently published comparison of the ambient ionization techniques direct analysis in real time (DART™) and DESI, it was reported that a protonated molecule was not observed for DART, whereas the protonated molecule could be observed for DESI and DAPCI. This is an incorrect observation, resulting from the use of different experimental conditions for DART than were used for the other two techniques.

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Boston College has selected the new JEOL MultiBeam Focused Ion Beam system and a Field Emission Scanning Electron Microscope for its nanofabrication clean room facility in Newton, Massachusetts.

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New mobile Scanning Electron Microscope that can travel or easily be moved to different locations as needed.

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High-productivity tool for IC defect analysis, circuit modification, TEM thin film sample preparation, and mask repair.

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Purchased six electron microscopes, including a newly introduced SEM-FIB (a dual column focused ion beam system) for the university's new Center of Excellence for Nano-Imaging in Los Angeles, California.

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One of the world's leading electron microscopes at Oak Ridge National Laboratory, the JEOL 2200FS Aberration Corrected Electron Microscope (ACEM), is ...

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The recent acquisition of Jeol's latest 300 kV field emission Transmission Electron Microscope (TEM), the JEM-3200FS, by Indiana University in the US ...

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Global Nanorace for New Materials Spurs Research and Industry

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Get the latest in mass spectrometry applications and news from JEOL USA through its new online newsletter, Mass Media.

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JEOL USA received a distinguished visitor at its Peabody, Massachusetts office on Tuesday, August 21st, when the 2007 Ernst Ruska Prize winner, Professor Hiroshi Jinnai of Kyoto Institute of Technology, visited JEOL’s U.S. headquarters.

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Wesleyan’s Advanced Instrumentation Center has scoped out better way to conduct infinitesimal scientific research. In the past six months, the center ...

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JEOL USA will introduce and demonstrate a new compact, high-performance, 400MHz NMR spectrometer at ACS Fall 2007, August 20-22, in booth #919-921.

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Microprobe installed at NIST in Gaithersburg, Maryland, in one of the world’s most technically advanced laboratories for developing new technologies and standards for a wide range of nanotechnology fields.

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A compilation of 28 applications notes describes analyses performed using the AccuTOFTM time-of-flight mass spectrometer with the DART® ion source. Samples analyzed include pharmaceuticals, illicit drugs, foods, flavors, fragrances, industrial products, forensic evidence, and biological fluids.

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New ink sampling technique takes a bite out of time

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Company celebrates 40 years of e-beam expertise

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JEOL USA (Peabody, Mass.) today announced a direct-write e-beam lithography system targeted at research labs and universities. The JBX-5500FS system i...

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A team of researchers from the Department of Energy's Lawrence Berkeley National Laboratory, Purdue University and Hysitron Inc. in Minneapolis are us...

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A new frontier on the head of a pin: Nanotechnology Institute at University of Alberta, Canada will explore new kinds of matter.

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For the seventh consecutive year, JEOL USA, Inc., a leader in the manufacture, sales, and service of electron microscopes and analytical instruments, has received the Omega NorthFace Scoreboard Award in recognition for its commitment to providing exemplary service and exceeding customer expectations.

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The University of York has taken a significant step into new fields of sub-Angstrom level materials research with the opening of the York JEOL Nanocen...

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Researchers at Harvard University’s Department of Molecular and Cellular Biology have selected JEOL as a partner in a collaborative effort to map the brain using high resolution SEM images

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JEOL USA is pleased to announce that the University of the Pacific has released information on the discovery of a breakthrough testing method for identifying foreign substances in pet food. Using the JEOL DART™ Direct Analysis in Real Time mass analysis technique on the AccuTOF-DART™ mass spectrometer, a chemistry professor and graduate student analyzed some of the recalled pet food.

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Distinguishes IU as a Major US Research Facility

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Electron Microscope Manufacturing Branch Achieves Significant Milestone

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NESM Celebrates 40th Anniversary

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Acquires high resolution micrographs at up to 1,000,000X

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High Spatial Resolution for Precise Defect Location through Multiple Layers

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For the first time in its 50+ year history, JEOL USA will be exhibiting at the IPC Printed Circuits Expo/APEX (February 18-22, 2007, Los Angeles, CA)

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Second U.S. patent covering the DART device and technology

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JEM-1400 Compact design and new GUI enhance ease of operation

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Biomedical research uses Cryo-EM to study eukaryotic membrane proteins and their relevance to asthma and blood coagulation

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A new technical paper describes the use of direct analysis in real time (AccuTOF-DART™) mass spectrometry for rapid screening and analysis of counterfeit drugs

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A new technical paper describes the use of direct analysis in real time (AccuTOF-DART™) mass spectrometry for writing ink analysis performed for forensic applications

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JEM-2100 LaB6 Transmission Electron Microscope (TEM) installed at Oklahoma State University’s new microscopy service laboratory

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JEOL USA has installed two transmission electron microscopes (TEMs) at the University of Texas Medical Branch’s (UTMB) newly-opened Cryo-electron Microscopy Center for Macromolecular Systems in Galveston, Texas

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In recognition for its commitment to providing exemplary service and exceeding customer expectations

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8nm minimum linewidth tool serves next generation of nanotechnology and beyond

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JEOL’s JWS 200 and 300mm Wafer Inspection SEMs

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Advanced optics that clearly reveal intricate surface details during observation of nano structures of medical, biological, materials science, and semiconductor samples

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JEOL first TEM supplier to provide on-the-go microscopy using cellular connection.

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JEOL USA, a leading supplier of electron micoscopes and analytical instruments with annual sales of more than $100 million, has appointed Sales Director Peter Genovese to the position of Vice President.

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A new applications notebook from JEOL USA comprises more than 25 recent applications notes resulting from analyses using the AccuTOF™ DART™ (Direct Analysis in Real Time) mass spectrometer

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A new single-column focused ion beam (FIB) system from JEOL makes automated, high-speed specimen preparation affordable at nearly one-third the cost of dual beam FIBs.

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Live demos of a new low vacuum, high resolution SEM, direct analysis in real time mass spectrometer (AccuTOF-DART™), and remote operation of ECA/ECX NMR spectroscopy systems will be ongoing in the JEOL booth, #2132 and 2133 at the Orange County Convention Center West Building, Orlando, Florida.

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High resolution tungsten scanning electron microscopes (SEMs) featuring multiple live image displays, streamlined graphical interface, and improved low kV operation

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DART™ (Direct Analysis in Real Time) to be demonstrated live at Pittcon 2006

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The USA subsidiary of JEOL Ltd., an international supplier of electron microscopes and analytical instruments, has entered into a partnership agreement with Massachusetts Institute of Technology’s Institute for Soldier Nanotechnologies (ISN)

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New Mass Spectrometry Source Enables Direct Analysis in Real Time

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Selected as one of the 100 most technologically significant products introduced into the marketplace in 2005

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Allows remote operation and imaging using the JEOL TEM

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New ASC24 24-position sample changer allows programmable, random order selection of sample tubes, improving NMR workflow for remote or unattended operation

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Ion Beam Cross Section Polishing and Hi-Res Imaging up to 1,000,000 X

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