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Thursday, May 17, 2012
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  NEWS & EVENTS : What's New  
News & Events
JEOL NEWS Magazine
 
All Items 13
2010 1
2009 1
2008 1
2007 1
2006 1
2005 1
2004 2
2003 2
2002 1
2000 1
1999 1
ALL ISSUES 13
Recent JEOL USA Press Releases

Tuesday, April 17, 2012

JEOL Introduces New Versatile FE-SEM Series for Sub-Nanometer Imaging and Analysis of Nanostructures and Magnetic Samples

Expanded imaging and analysis capabilities customizable to performance requirements

 


Wednesday, April 11, 2012

JEOL Resonance Introduces Worlds' Fastest and Smallest Solid State NMR Probe

110kHz Magic Angle Spinning, a record for spinning speed with JEOL Resonance’s new 0.75 mm Solid State NMR Probe

 


Thursday, November 10, 2011

Japanese Consul Visits JEOL USA Scientific Instrument Supplier

Toured the company's U.S. corporate office in Peabody, Massachusetts accompanied by the Consul of Economic Affairs


Sunday, October 23, 2011

JEOL Chemist Receives Prestigious Anachem Award

Awarded to JEOL USA Mass Spectrometry Product Manager, Dr. Robert (Chip) Cody


Wednesday, October 05, 2011

JEOL Opens New Office in Brasil

Direct support through JEOL service engineers, administrative, and sales personnel


Thursday, September 29, 2011

JEOL USA Partners with Chilean Agent Arquimed

One of Chile’s largest and most respected distributors of scientific, medical, educational, and industrial tools and equipment


Tuesday, July 12, 2011

JEOL Unveils New High Throughput, Automated TEM for Nano-analysis

For process and quality control of mass produced semiconductor and materials samples


Friday, July 08, 2011

New JEOL Large Angle Energy Dispersive Spectrometer (EDS) for Ultrafast Elemental Mapping of S/TEM Samples

New generation of Energy Dispersive Spectrometer (EDS) for ultrafast, ultrasensitive collection of X-rays through analysis with its Scanning Transmission Electron Microscopes


Monday, July 04, 2011

JEOL Introduces New Environmental Control System for Scientific Instrument Labs

Controls room temperature without air turbulence, noise, or vibration


Monday, July 04, 2011

JEOL InTouchScope Scanning Electron Microscope Wins R&D 100 Award

One of the 100 most technologically significant products introduced into the marketplace over the past year



 
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