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Tuesday, July 22, 2014
JEOL Scanning Electron Microscopes
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JSM-6510LV Series Scanning Electron Microscope

World’s most widely-used family of SEMs!

The JSM-6510 series SEMs are high-performance, low cost, scanning electron microscopes for fast characterization on a wide variety of sample types. Offered in both high vacuum and low vacuum models, this SEM is widely-used in all research fields and industrial applications.

Our Low Vacuum model provides the versatility of dealing with samples that are wet, oily, outgas excessively or are non-conductive without pretreatment.

Throughout the evolution of this popular SEM family, JEOL has continued to enhance features and capabilities to offer the best possible imaging resolution, versatility, and operator interface. The JSM-6510 series SEMs come ready for installation of additional analytical attachments such as energy dispersive X-ray spectrometer (EDS), electron backscatter diffraction (EBSD), and cathodoluminescence detectors (CL). The large chamber and mechanically eucentric stage offers full coverage of samples as large as 125mm in diameter.

JSM-6510LV Details

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