World’s most widely-used family of SEMs!
The JSM-6610 series SEMs are high-performance scanning electron microscopes for fast characterization and imaging of fine structures. With a large chamber and stage, this series of SEMs can easily handle a wide variety of sample sizes and shapes and is widely-used in all research fields and industrial applications.
Our Low Vacuum model provides the versatility of dealing with samples that are wet, oily, outgas excessively or are non-conductive without pretreatment.
Throughout the evolution of this popular SEM family, JEOL has continued to enhance features and capabilities to offer the best possible imaging resolution, versatility, and operator interface. With a high resolution of 3.0nm at 30kV and unsurpassed low kV performance, the JSM-6610 series SEMs deliver amazing clarity of the finest structures. With a large sample chamber and multiple ports, the JSM-6610 series comes ready for installation of additional analytical attachments such as: energy dispersive X-ray spectrometer (EDS), electron backscatter diffraction (EBSD), cathodoluminescence detectors (CL), wavelength dispersive X-ray spectrometer (WDS), chamberscopes, heating/cooling substages etc.