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ClairScope™ Atmospheric SEM/Correlative Microscope

JEOL is the first to develop a truly integrated correlative microscopy tool that consists of an optical microscope coupled with a scanning electron microscope (SEM). Coupling optical microscopy with SEM not only yields complimentary information but also affords the high spatial resolution only achievable through SEM imaging. The key to the design of this instrument is that it allows concurrent imaging of a sample in its native state (in solution) at atmospheric pressure and temperature, by both the optical microscope and SEM.

The specimen area is open, allowing for easy sample manipulation and reagent exchange. The sample holder incorporates a thin film window for SEM imaging of materials (liquids, gels, solids, etc.) at atmosphere. Dynamic phenomena such as crystallization, drying processes, and electrochemical reactions can be followed in real time. Biological materials can be imaged without the lengthy pretreatment (dehydration, fixation, coating, etc.) necessary in conventional SEMs.

The ClairScope™, recipient of the 2010 R&D 100 Award, is recognized by the editors of R&D Magazine as one of the 100 most technologically significant products introduced into the marketplace over the past year. The R&D 100 Awards have been a benchmark of excellence for industry since 1963.

ClairScope™ Details
  • Integrates light microscopy with high resolution Scanning Electron Microscopy in a single system
  • Concurrent imaging without sample exchange
  • Samples remain in native state, at atmospheric temperature and pressure
  • Imaging of wet samples and solutions
  • Observation of dynamic phenomena in real time

 

Optical microscope (OM)
Mirror unit 2 Units Standard [Bright Field Imaging and UV Irradiation for Fluorescent Imaging]
Option: Up to 6 Mirror Units Available
Objective lens 40X Liquid Immersion Lens. Option: Other Objectives Available.
CCD camera High Sensitivity Color CCD Camera [1,600 x 1,200 Pixels]
Scanning Electron Microscope
Source/Resolution W/8nm (30kV)
Accelerating Voltage 10, 20, 30kV
Magnification 100X to 100,000X
Detector High Sensitivity Solid State BSE
Sample holder
Thin Film Dish 32mm Diameter (Volume ~ 10ml); 0.25mm2 Active Window for SEM
Other
Computer PC/Windows Vista
Monitor 2 19” LCD Displays

*Windows Vista is a registered trademark of Microsoft.

Atmospheric Scanning Electron Microscope enables observation of cells in buffer under normal atmospheric pressure
2/9/2012 840.0 KB
Atmospheric Scanning Electron Microscope observes cells in solution as an optical- and electron-correlative microscope
2/9/2012 9.2 MB
ClairScope™ JASM-6200 Product Information
2/9/2012 237.5 KB
JEOL News Vol. 45 No. 1 - Rapid Characterization of Bacteria Using ClairScope™ and SpiralTOF™
2/9/2012
Rapid imaging of mycoplasma in solution using Atmospheric Scanning Electron Microscopy (ASEM)
2/9/2012
The Atmospheric Scanning Electron Microscope with open sample space observes dynamic phenomena in liquid or gas
2/9/2012
ClairScope introduction at Microscopy & Microanalysis July 2009.
Mitsuo Suga of JEOL, Ltd. discusses the capabilities of this new microscope.
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