The JSM-7001FTTLS LV combines JEOL’s proven "in-the-lens" field emission gun technology and electron optics with a unique Through-the-Lens System (TTLS). TTLS incorporates new objective lens and detector technology - plus low vacuum imaging - to create a highly versatile, ultrahigh resolution analytical FEG SEM.
Ultrahigh Resolution Imaging
This new FE SEM produces high resolution imaging results at ultra low kV. Observing the specimen surface at low voltage reduces beam penetration, specimen damage and charge buildup, allowing the user to see true surface details. The on-axis TTL detector, with in-column energy filter and beam deceleration (Gentle Beam Mode), improves resolution at low electron energies, allowing for observation of fine surface structures at very low voltages and very high magnification.
High Spatial Resolution Microanalysis
Designed for versatility, this analytical SEM achieves high spatial resolution microanalysis using EDS, WDS, EBSD, and CL. The integrated and automated aperture angle control lens (ACL) provides 
optimum probe size and optimum convergence angle for a wide range of applications. An optional retractable solid-state or PMT STEM detector allows imaging of thin, electron-transparent samples with sub 0.8nm resolution, and allows simultaneous imaging and EDS analysis.
Low Vacuum Operation
The flexibility of this SEM is displayed in its ability to run in low vacuum (LV) mode for imaging nonconductive samples at high kV and beam currents for a variety of analytical applications. The system includes in vacuo removal of both differential pumping apertures for uncompromised imaging at all beam currents.
In Lens Detectors-TTLS
The JSM-7001FTTLS LV has a new objective lens with the TTL detectors with an energy filter operational with the Gentle Beam to enhance ultra low voltage performance. An additional benefit of the new TTL system is the ability to image and analyze highly magnetic samples. The TTLS operates at low magnification (10X) with no distortion of the image or the EBSD pattern, allowing collection of large area EBSD maps of large grain materials.