The JSM-7100F is a highly versatile, easy-to-use analytical field emission SEM that offers a new level of expanded performance to the budget-conscious lab. This high resolution SEM is ideal for both imaging and analysis of nanostructures, and determining chemical composition of the sample through X-ray spectroscopy. By combining large beam currents with a small probe size at ANY accelerating voltage, the JEOL JSM-7100F dramatically increases analytical resolution to the sub 100nm scale.
For the lab using multiple analytical techniques or requiring special capabilities, the JSM-7100F is available with low vacuum operation (JSM-7100F LV) for non-conductive samples and for enhanced high resolution imaging of nanostructures, specimen surface details and magnetic samples (JSM-7100FT).
The JSM-7100F is equipped with a large specimen chamber that accommodates a wide variety of detectors simultaneously, including: multiple EDS, WDS, STEM, BSE, and IR camera. The system can also be equipped with a variety of sub stages including tensile, heating and cooling stages for in situ experimentation.