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JSM-6010LA InTouchScope™

Defining a new class of SEM.

The InTouchScope brings a whole new SEM experience to the lab with the familiar look and feel of a Smartphone or a tablet. It offers exceptional value and the versatility as a research grade SEM in a compact and portable design.

When you need higher resolution, imaging with multiple detectors, elemental information, and a range of acceleration voltages at both high and low vacuum modes, the InTouchScope offers this flexibility at an affordable price.

Integrated Energy Dispersive Spectroscopy (EDS) with the latest Silicon Drift Detector (SDD) technology enables comprehensive analysis.

The intuitive multi-touch screen interface puts all SEM "Apps" at the operator’s fingertips. The user can expand windows and images with the sweep of two fingers, dial in magnification and focus with a swipe, and select operating parameters, analytical functions, or measure distances just by tapping the PC or notebook touch screen.

The InTouchScope™, recipient of the 2011 R&D 100 Award, is recognized by the editors of R&D Magazine as one of the 100 most technologically significant products introduced into the marketplace over the past year. The R&D 100 Awards have been a benchmark of excellence for industry since 1963.

JSM-6010LA InTouchScope™ Details

Ease of use is a key feature of all JEOL SEMs, and the versatile InTouchScope has functions that users of all levels will appreciate:

  • high resolution imaging in HV/LV/SE/BSE
  • chemical analysis with integrated EDS
  • multi-touch screen control and wireless operation
  • automatic SEM condition setup based on sample type
  • simultaneous multiple live image and movie capture
  • fast sample navigation at 5x – 300,000x magnifications
  • portable, compact, small footprint SEM

The InTouchScope features all the capabilities of a full size tungsten SEM with integrated EDS analysis in a small, ergonomic and intuitive design. An onboard turbo pump make this a truly self-contained, portable SEM that is easy to set up anywhere in the lab.

Resolution High Vacuum mode: 4nm (20kV), 8nm (3kV), 15nm (1kV)
Low Vacuum mode: 5nm (20kV) BSE
Accelerating voltage 500V to 20kV
Magnification x5 to x300,000 (printed as a 128mm x 96mm micrograph)
LV detector Multi-segment BSED (std.)
LV-SED (option)
LV pressure 10 to 100 Pa
Maximum specimen size Observation:125mm diameter
Loadable:152mm
Height:50mm
LGS type stage Eucentric goniometer
X=80mm, Y=40mm, Z=5mm-48mm
R=360° (endless)
Tilt -10/+90°
(Computer controlled 2, 3 or 5 axis motor drive: Option)
Frame Store Up to 5120×3840 pixels
EDS Standard (LA Version)
Embedded EDS system (silicon drift detector technology)
Includes: Spectral Mapping, Multi-Point Analysis, Automatic Drift Compensation
PC Notebook or Desktop Type (Multi-Touch Screen)

 

InTouchScope Video
InTouchScope Video
Find a Local Salesman
Find a Local Salesman
SPIE Scanning-Defense 2012
SPIE Scanning-Defense 2012

 
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