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  PRODUCTS : Electron Optics : Scanning Electron Microscopes (SEM) : HV/LV Tungsten/LaB6 SEMs  
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High/Low Vacuum Tungsten or LaB6 SEMs
  • High Vacuum: Ideal for failure analysis, inspection, and characterization.
  • Low Vacuum: For imaging and X-ray analysis of wet, nonconductive, unprepared samples.

Available Models

  Resolution Accelerating
Voltage		 Magnification Stage
JSM-6510 3.0nm 0.5 to 30 kV x5 to 300,000
(printed as a 128mm x 96mm micrograph)		 GS Type: X=20mm, Y=10mm
LGS Type: X=80mm, Y=40mm
JSM-6510LV HV 3.0nm
LV 4.0nm		 0.5 to 30 kV x5 to 300,000
(printed as a 128mm x 96mm micrograph)		 GS Type: X=20mm, Y=10mm
LGS Type: X=80mm, Y=40mm
JSM-6610 3.0nm 0.3 to 30 kV x5 to 300,000
(printed as a 128mm x 96mm micrograph)		 X=125mm, Y=100mm

JSM-6610LV

 HV 3.0nm
LV 4.0nm		 0.3 to 30 kV x5 to 300,000
(printed as a 128mm x 96mm micrograph)		 X=125mm, Y=100mm
JSM-6010LA InTouchScope™ 4.0nm @ 20kV 0.5 to 20kV 5X to 300,000X LGS - Eucentric

 
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