JEOL is the first to develop a truly integrated correlative microscopy tool that consists of an optical microscope coupled with a scanning electron microscope (SEM). Coupling optical microscopy with SEM not only yields complimentary information but also affords the high spatial resolution only achievable through SEM imaging. The key to the design of this instrument is that it allows concurrent imaging of a sample in its native state (in solution) at atmospheric pressure and temperature, by both the optical microscope and SEM.

The specimen area is open, allowing for easy sample manipulation and reagent exchange. The sample holder incorporates a thin film window for SEM imaging of materials (liquids, gels, solids, etc.) at atmosphere. Dynamic phenomena such as crystallization, drying processes, and electrochemical reactions can be followed in real time. Biological materials can be imaged without the lengthy pretreatment (dehydration, fixation, coating, etc.) necessary in conventional SEMs.

• Download the ClairScope Product Sheet.
• View the poster "Atmospheric Scanning Electron Microscope enables observation of cells in buffer under normal atmospheric pressure"
• View the poster "Atmospheric Scanning Electron Microscope observes cells in solution as an optical- and electron-correlative microscope"