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  PRODUCTS : Electron Optics : Scanning Electron Microscopes (SEM) : Benchtop  
JEOL Scanning Electron Microscopes
Electron Optics
Resources
Also See
JEOL Benchtop SEMs
  • High Vacuum: Ideal for failure analysis, inspection, and characterization.
  • Low Vacuum: For imaging and X-ray analysis of wet, nonconductive, unprepared samples.

Available Models

  Resolution Accelerating
Voltage
Magnification Stage
NeoScope
Benchtop SEM
  15 kV, 10 kV, 5kV
(3-position switch)
x10 to 20,000
(printed as a 128mm x 96mm micrograph)
Manual control for X and Y
X: 35mm, Y: 35mm


 
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