Request Product InfoFind a Local OfficeSearch
 
JEOL
Thursday, May 23, 2013
Login
Register
  PRODUCTS : Electron Optics : Scanning Electron Microscopes (SEM) : Benchtop  
JEOL Scanning Electron Microscopes
Electron Optics
Resources
Also See
Link to Mobile
JEOL Benchtop SEMs
  • High Vacuum: Ideal for failure analysis, inspection, and characterization.
  • Low Vacuum: For imaging and X-ray analysis of wet, nonconductive, unprepared samples.

Available Models

  Resolution Accelerating
Voltage
Magnification Stage
NeoScope
Benchtop SEM
  15 kV, 10 kV, 5kV
(3-position switch)
10-60,000X
(printed as a 128mm x 96mm micrograph)
Manual control for X and Y
X: 35mm, Y: 35mm

 
  Copyright 2006-2013 JEOL USA, Inc. | Privacy Statement | Terms Of Use
  Designed & Powered by the Swanzey Internet Group