JEOL USA Scanning Electron Microscopes (SEM)

Tuesday, June 18, 2013
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PRODUCTS : Electron Optics : Scanning Electron Microscopes (SEM)

JEOL Scanning Electron Microscopes

HV/LV Tungsten/LaB6 SEMs

JSM-6510LV

JSM-6610LV

JSM-6010LA InTouchScope™

Atmospheric SEM

ClairScope™ JASM-6200

Benchtop

NeoScope Benchtop SEM

JIB-4600F / MultiBeam

Stage Navigation System

Electron Optics
Resources

Documents & Downloads

Also See

Scanning Electron Microscopes (SEM)

Transmission Electron Microscopes (TEM)

Surface Analysis (SA)

Link to Mobile

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Featured Models

6610LV

HV/LV Tungsten and LaB6 SEMs

7800F

Extreme-resolution Analytical Field Emission SEM

NeoScope Benchtop SEM

Benchtop SEM

ClairScope™

Atmospheric SEM

InTouchScope™

Portable Analytical SEM

JEOL Scanning Electron Microscopes

JEOL has played a leading role in the development and evolution of scanning electron microscopes since the early 1960s. JEOL provides valuable applications support, comprehensive training, and award-winning service for the long lifetime of our instruments.

JEOL innovations in resolution and functionality enable the microscopist to better image and characterize a new generation of nanomaterials, capture biological details, analyze forensic evidence in detail, direct write fine nanopatterns, and pinpoint elusive quality problems.

We offer a wide range of SEM models:

High Vacuum Tungsten/LaB6 SEMs: ideal for failure analysis, inspection, and characterization.
Low Vacuum Tungsten/LaB6 SEMs: for imaging and X-ray analysis of wet, nonconductive, unprepared samples.
Portable Analytical SEM: the InTouchScope with multi-touch screen.
Field Emission HV/LV SEMs: higher resolution, high stability and high current in a small spot size and chemical analysis at high resolution conditions.
Semi-in-Lens Field Emission HV/LV SEMs: highest resolution SEMs; the finest probe size, especially at low accelerating voltages; reduced noise at lower working distances.
Benchtop SEM: the NeoScope features 40,000x with outstanding depth of field.
Atmospheric SEM: the ClairScope is a truly integrated correlative microscopy tool.

JEOL USA has also developed many unique solutions for SEM applications including:

Sample holders for a wide variety of imaging needs
Stage navigation system
Hot cell
Environmental chamber

We offer tailored applications solutions in concert with our partners, including:

Omniprobe – gas-assisted lithography
Protochips – thermal dynamic analysis
JC Nabity – nanometer pattern generation
Gatan – cryo transfer systems, cathodoluminescence (CL)
Kleindiek – nanomanipulation
EDAX – EDS, EBSD, X-ray
Oxford – EDS, EBSD, WDS
Bruker AXS – EBSD, Microanalysis
Thermo – EDS, EBSD, X-ray

Additional Reading:

Visit our Resources Page to download published articles and technical notes
Download your comprehensive copies of SEM A to Z and SEM Q&A