JEOL USA JSPM-4500 Scanning Probe Microscope

The JSPM-4500 UHV SPM is designed for the high resolution study of surfaces. This instrument is available as individual components for labs that already have a suitable vacuum chamber or as a complete system including vacuum system. The complete package offers both a chamber for sample preparation and modification and a chamber for imaging. Additional chambers can be added to accommodate additional sample preparation and analysis. Atomic scale imaging with both AFM and STM modes is available. Variable temperature options allow imaging with sample temperatures from less than 20K to above 1500K. STM modes include CITS, I-V, S-V, and I-S. Standard AFM modes include contact, friction force microscopy, current image, non-contact and discrete contact with frequency detection, and phase imaging.

JSPM-4500 Key Product Features

Image Resolution	Vertical and Horizontal Atomic in STM and AFM
Scan System	Tip Scan
Scanner	Tube Scanner (SPM) Shared Stack Scanner (dedicated STM only)
Scan Range Tube Scanner Stack Scanner	XY: 6.5 µm, Z: 1 µm XY: 0.2 µm, Z: 0.1 µm
Force Detection	Optical lever arm, laser light source, 4 segment photodetector
Tunnel Current	30 pA to 1 µA
Bias Voltage	±10 V
AFM probe	Silicon and Silicon Nitride
STM probe	0.3 mm diameter wire
Coarse Stage Adjustment XY stage: ±3m	Z stage: manual adjustment 10 mm stepper motor adjustment: 0.5 mm XY stage: motor driven ±1 mm
Stage	Drift Free design
Vibration Isolation	Air suspension
Temperature Variation	Less than 20° K to approximately 1500° K
Port Flange	8 inch Conflat
Computer	IBM compatible, current speed and memory