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  PRODUCTS : Electron Optics : Transmission Electron Microscopes (TEM) : 200 kV : JEM-2100F  
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JEM-2100F Transmission Electron Microscope

JEM-2100FThe JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic level structural analyses in biology, medicine, and materials sciences as well as the semiconductor and pharmaceutical industries.

The JEM-2100F has been developed to achieve the highest image quality and the highest analytical performance in the 200kV class analytical TEM with a probe size under 0.5nm. The new side-entry goniometer stage provides ease of use tilt, rotation, heating and cooling, programmable multi-point settings--all without mechanical drift. The JEM-2100F can be equipped with STEM, MDS, EDS, EELS, and CCD-cameras.

JEM-2100F Key Product Features
  Ultra High Resolution Specimen
High Tilt
High Resolution Cryo High Contrast
Resolution
Lattice Image
Point Image

0.1nm
0.19nm

0.1nm
0.25nm

0.1nm
0.23nm

0.14nm
0.27nm

0.14nm
0.31nm
Accelerating Voltage
Range
Variable Steps
Stability

80 - 200 kV
50 V min.
2 ppm/min.
Magnification (steps)
Mag Mode (30)
Low Mag Mode (20)
SA Mag Mode (21)

x2,000-1,500,000
x50-6,000
x8,000-800,000

x1,500-1,200,000
x50-6,000
x6,000-600,000

x2,000-1,500,000
x50-6,000
x8,000-800,000

-
x50-6,000
-

-
x50-6,000
-
Camera Length (steps)
SA DIFF (15)
HD DIFF (14)
HR DIFF

80-2,000mm
4-80mm
333mm

100-2,500mm
4-80mm
333mm

80-2,000mm
4-80mm
333mm

-
-
-

-
-
-
Objective Lens
Polepiece
Focal Length
Spherical Aberration Coefficient
Chromatic Aberration Coefficient
Minimum Focal Step
Exciting Current Stability


URP
1.9mm
0.5mm
1.1mm
1.0nm
1 ppm/min.


HRP
2.7mm
1.4mm
1.8mm
1.8nm
1 ppm/min.

HTP
2.3mm
1.0mm
1.4mm
1.5nm
1 ppm/min.

CRP
-
-
-
-
1 ppm/min.

HCP
-
-
-
-
1 ppm/min.
Specimen Stage Micro active goniometer
Specimen Chamber
Specimen per Load
Specimen Tilt Angle (X-axis)
Specimen Tilt Angle (Y-axis)

1
±25°
±25°

1
±42°
±30°

1
±35°
±30°

1
±60°
-

1
±38°
±30°
Specimen Movements
X Direction
Y Direction
Z Direction

2.0mm
2.0mm
0.2mm
(±0.1mm)

2.0mm
2.0mm
0.4mm
(±0.2mm)

2.0mm
2.0mm
0.4mm
(±0.2mm)

2.0mm
2.0mm
0.4mm
(±0.2mm)

2.0mm
2.0mm
0.4mm
(±0.2mm)

note: configuration must be chosen at time of purchase.

 
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