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Saturday, February 04, 2012
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JEOL Transmission Electron Microscopes
Electron Optics
Resources
Also See
Application Images
  • Elemental mapping in flash memory.
  • Cauloblacter Cb13b1a cells (Phase plate image courtesy of Dr. Elizabeth Wright, Emory University).
  • Elk fibrils imaged with hole-free phase plate (courtesy of H. Young, J.P. Glaves (biochemistry, University of Alberta), Julie Qian, NINT Electron Microscopy).
  • 3D reconstruction showing Pd particles.
  • 0-loss energy filtered image of a flash memory.
  • High resolution image of Au particles.
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JEM-2200FS Transmission Electron Microscope

The JEM-2200FS analytical TEM combines a 200kV field emission gun (FEG) and in in-column energy filter (Omega Filter) to produce a high-end, optimally configured TEM for energy filtered imagery and chemical analysis of specimens.

The JEM-2200FS also utilizes a rotation-free image-forming optical system which not only facilitates acquisition of TEM images and diffraction patterns but also produces stable spectra data.

JEM-2200FS Details
  • Built-in energy filter
  • High contrast imaging
  • Tomography
  • No darkroom required with LCD monitor
  • Extensive functions for image processing and computer analysis
Point-image Resolution 0.19nm /.23nm /.25nm /.28nm (200kV)
Accelerating Voltage up to 200kV
Magnification
on 18-inch LCD
x100-1,500,000
Eletron gun ZrO/W (100) Schottky
Camera Length
on 18-inch LC
200-2,000mm
Spectrometer In-column filter
Spot size 0.2nm
Objective lens Sperical aberration coefficient (s) 0.5mm /1.0mm /1.4mm /2.2mm
Chromatic aberration coefficient (Cc) 1.1mm /1.4mm /1.8mm /2.0mm

note: configuration must be chosen at time of purchase.

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