JEOL USA JEM-2200FS Transmission Electron Microscope

The new JEM-2200FS combines a 200kV field emission gun (FEG) and in in-column energy filter (Omega Filter) to produce a high-end, optimally configured TEM for energy filtered imagery.

The JEM-2200FS also utilizes a new, rotation-free image-forming optical system which not only facilitates acquisition of TEM images and diffraction patterns but also produces stable spectra data.

Built-in energy filter
High contrast imaging
Tomography
No darkroom required with LCD monitor
Extensive functions for image processing and computer analysis

JEM-2200FS Key Product Features

Point-image Resolution		0.19nm /.23nm /.25nm /.28nm (200kV)
Accelerating Voltage		up to 200kV
Magnification on 18-inch LCD		x100-1,500,000
Eletron gun		ZrO/W (100) Schottky
Camera Length on 18-inch LC		200-2,000mm
Spectrometer		In-column filter
Spot size		0.2nm
Objective lens	Sperical aberration coefficient (s)	0.5mm /1.0mm /1.4mm /2.2mm
	Chromatic aberration coefficient (Cc)	1.1mm /1.4mm /1.8mm /2.0mm

note: configuration must be chosen at time of purchase.