JEOL USA JEM-2500SE Transmission Electron Microscope

The new JEM-2500SE is an easy-to-use STEM designed for professional researchers who demand efficiency and high performance. The JEM-2500SE works like a SEM , but provides the high-resolution results of a TEM.

Easy-to-use, includes a user-friendly GUI
One-touch operation for TEM/STEM/SEI and diffraction pattern functions
Highest TEM magnification available
No darkroom required with LCD monitor
Automated for repeatable results

JEM-2500SE Key Product Features

	STEM	TEM
Resolution Lattice Image	0.2nm	0.14nm
Accelerating Voltage Range	200 kV
Magnification on 18-inch LCD	x100-10,000,000	x4,000-20,000,000
Camera Length on 18-inch LCD Scanning Coll Variable Apertures	60-500mm 2-stage electromagnetic deflection condenser lens variable aperture objective lens variable aperture selected-area variable aperture all motorized
Specimen Stage	Micro active motorized goniometer
Specimen Chamber Specimen Tilt Angle (X-axis) Specimen Tilt Angle (Y-axis)	±30° ±30°
Specimen Movements X Direction Y Direction Z Direction	±1.0mm ±1.0mm ±0.5mm

note: configuration must be chosen at time of purchase.